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Statistical patent analysis indicators as a means of determining country technological specialisation

  • Ekaterina Khramova


    (Research Fellow, Institute for Statistical Studies and Economics of Knowledge)

  • Dirk Meissner


    (Deputy Head, Laboratory for Science and Technology Studies, Institute for Statistical Studies and Economics of Knowledge, National Research University Higher School of Economics)

  • Galina Sagieva


    (Senior Research Fellow, Institute for Statistical Studies and Economics of Knowledge; Department Head, Department for Research of Intellectual Property and Technology Transfer)

Patent data provide a rich set of information which can be used for comparative studies and trend analysis. The paper presents a systematic overview of the most appropriate tools methodologies that are available for determining the technological specialization of countries. Such analysis includes a discussion of databases, approaches, and indexes appropriate for this kind of analysis. This paper discusses different indicators of technological specialisation, concentration, and patent quality are analysed, including Revealed Technological Advantage (RTA) index, patent share, C20 concentration index, and Gini concentration index. the main available patent databases, especially those with open access, and summarizes arguments for the study of technological specialisation based on assignee and inventor patent data. Also the limits and potentials of the statistics on resident / nonresident patenting on internal and external markets are discussed in the paper.

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Paper provided by National Research University Higher School of Economics in its series HSE Working papers with number WP BRP 09/STI/2013.

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Length: 20 pages
Date of creation: 2013
Date of revision:
Publication status: Published in WP BRP Series: Science, Technology and Innovation / STI, April 2013, pages 1-20
Handle: RePEc:hig:wpaper:wpbrp09sti2013
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