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An optimal burn‐in policy based on a degradation model

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  • E. Mosayebi Omshi
  • S. Shemehsavar

Abstract

Burn‐in tests help manufacturers detect defective items and remove them before being sold to customers. In a competitive marketplace, cost is a major consideration and not employing a burn‐in test may result in higher and needless expenses. With this in mind, we consider degradation‐based burn‐in tests in which the degradation path follows a Wiener process and weak items are identified when the process crosses a piecewise linear function. We also study linear functions as a special case of such a piecewise linear barrier. Within this setup, we apply a cost model to determine the optimal burn‐in test. Finally, we discuss an illustrative example using GaAs laser degradation data and present an optimal burn‐in test for it.

Suggested Citation

  • E. Mosayebi Omshi & S. Shemehsavar, 2018. "An optimal burn‐in policy based on a degradation model," Applied Stochastic Models in Business and Industry, John Wiley & Sons, vol. 34(4), pages 486-498, July.
    • Handle: RePEc:wly:apsmbi:v:34:y:2018:i:4:p:486-498
    DOI: 10.1002/asmb.2314
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