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Reliability sampling plans for the Weibull distribution under Type II progressive censoring with binomial removals

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  • Siu-Keung Tse
  • Chunyan Yang

Abstract

This paper presents reliability sampling plans for the Weibull distribution under Type II progressive censoring with random removals (PCR), where the number of units removed at each failure time follows a binomial distribution. To construct the sampling plans, the sample size n and the acceptance constant k are determined based on asymptotic distribution theory. The resulting sampling plans are tabulated for selected specifications under the proposed censoring scheme. Furthermore, a Monte Carlo simulation is conducted to validate the true probability of acceptance for the designed sampling plans.

Suggested Citation

  • Siu-Keung Tse & Chunyan Yang, 2003. "Reliability sampling plans for the Weibull distribution under Type II progressive censoring with binomial removals," Journal of Applied Statistics, Taylor & Francis Journals, vol. 30(6), pages 709-718.
    • Handle: RePEc:taf:japsta:v:30:y:2003:i:6:p:709-718
    DOI: 10.1080/0266476032000053781
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    References listed on IDEAS

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    1. Uditha Balasooriya & Sutaip L. C. Saw, 1998. "Reliability sampling plans for the two-parameter exponential distribution under progressive censoring," Journal of Applied Statistics, Taylor & Francis Journals, vol. 25(5), pages 707-714, June.
    2. Siu Keung Tse & Chunyan Yang & Hak-Keung Yuen, 2000. "Statistical analysis of Weibull distributed lifetime data under Type II progressive censoring with binomial removals," Journal of Applied Statistics, Taylor & Francis Journals, vol. 27(8), pages 1033-1043.
    3. Siu-Keung Tse & Hak-Keung Yuen, 1998. "Expected experiment times for the Weibull distribution under progressive censoring with random removals," Journal of Applied Statistics, Taylor & Francis Journals, vol. 25(1), pages 75-83.
    4. Uditha Balasooriya & Sutaip. L. C. Saw, 1999. "A note on approximate moments of progressively censored order statistics," Metron - International Journal of Statistics, Dipartimento di Statistica, Probabilità e Statistiche Applicate - University of Rome, vol. 0(1-2), pages 117-130.
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    Cited by:

    1. Conghua Cheng & Jinyuan Chen & Jianming Bai, 2013. "Exact inferences of the two-parameter exponential distribution and Pareto distribution with censored data," Journal of Applied Statistics, Taylor & Francis Journals, vol. 40(7), pages 1464-1479, July.
    2. Luo, Wei & Zhang, Chun-hua & Chen, Xun & Tan, Yuan-yuan, 2015. "Accelerated reliability demonstration under competing failure modes," Reliability Engineering and System Safety, Elsevier, vol. 136(C), pages 75-84.
    3. Min Kim & Bong-Jin Yum, 2011. "Life test sampling plans for Weibull distributed lifetimes under accelerated hybrid censoring," Statistical Papers, Springer, vol. 52(2), pages 327-342, May.
    4. Min Kim & Bong-Jin Yum, 2009. "Reliability acceptance sampling plans for the Weibull distribution under accelerated Type-I censoring," Journal of Applied Statistics, Taylor & Francis Journals, vol. 36(1), pages 11-20.
    5. Wei Luo & Chun-Hua Zhang & Xun Chen & Yuan-Yuan Tan, 2013. "Reliability demonstration based on accelerated degradation testing for unknown model parameters," Journal of Risk and Reliability, , vol. 227(2), pages 162-172, April.
    6. Wu, Shuo-Jye & Huang, Syuan-Rong, 2012. "Progressively first-failure censored reliability sampling plans with cost constraint," Computational Statistics & Data Analysis, Elsevier, vol. 56(6), pages 2018-2030.
    7. Sukhdev Singh & Yogesh Tripathi, 2015. "Reliability sampling plans for a lognormal distribution under progressive first-failure censoring with cost constraint," Statistical Papers, Springer, vol. 56(3), pages 773-817, August.
    8. Maram Salem & Zeinab Amin & Moshira Ismail, 2020. "Progressively Censored Reliability Sampling Plans Based on Mean Product Lifetime," Sankhya B: The Indian Journal of Statistics, Springer;Indian Statistical Institute, vol. 82(1), pages 1-33, May.

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