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Design and evaluation of skip-lot sampling inspection plans with double-sampling plan as the reference plan

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  • R. Vijayaraghavan
  • V. Soundararajan

Abstract

This paper presents a design for skip-lot sampling inspection plans with the double-sampling plan as the reference plan, so as to reduce the sample size and produce more efficient plans in return for the same sampling effort. The efficiency of the proposed plan compared with that of the conventional double-sampling plan is also discussed. The need for smaller acceptance numbers under the plan is highlighted. Methods of selecting the plan indexed by the acceptable quality level and limiting quality level, and by the acceptable quality level and average outgoing quality level are also presented.

Suggested Citation

  • R. Vijayaraghavan & V. Soundararajan, 1998. "Design and evaluation of skip-lot sampling inspection plans with double-sampling plan as the reference plan," Journal of Applied Statistics, Taylor & Francis Journals, vol. 25(3), pages 341-348.
    • Handle: RePEc:taf:japsta:v:25:y:1998:i:3:p:341-348
    DOI: 10.1080/02664769823070
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    Cited by:

    1. Chien-Wei Wu & Ming-Hung Shu & Pei-An Wang & Bi-Min Hsu, 2021. "Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives," Computational Statistics, Springer, vol. 36(2), pages 1391-1413, June.
    2. D. Malathi & S. Muthulakshmi, 2017. "Economic design of acceptance sampling plans for truncated life test using Frechet distribution," Journal of Applied Statistics, Taylor & Francis Journals, vol. 44(2), pages 376-384, January.

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