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Identifying technological competition trends for R&D planning using dynamic patent maps: SAO-based content analysis

Author

Listed:
  • Janghyeok Yoon

    (Konkuk University)

  • Hyunseok Park

    (Pohang University of Science and Technology)

  • Kwangsoo Kim

    (Pohang University of Science and Technology)

Abstract

Patent maps showing competition trends in technological development can provide valuable input for decision support on research and development (R&D) strategies. By introducing semantic patent analysis with advantages in representing technological objectives and structures, this paper constructs dynamic patent maps to show technological competition trends and describes the strategic functions of the dynamic maps. The proposed maps are based on subject-action-object (SAO) structures that are syntactically ordered sentences extracted using the natural language processing of the patent text; the structures of a patent encode the key findings of the invention and expertise of its inventors. Therefore, this paper introduces a method of constructing dynamic patent maps using SAO-based content analysis of patents and presents several types of dynamic patent maps by combining patent bibliographic information and patent mapping and clustering techniques. Building on the maps, this paper provides further analyses to identify technological areas in which patents have not been granted (“patent vacuums”), areas in which many patents have actively appeared (“technological hot spots”), R&D overlap of technological competitors, and characteristics of patent clusters. The proposed analyses of dynamic patent maps are illustrated using patents related to the synthesis of carbon nanotubes. We expect that the proposed method will aid experts in understanding technological competition trends in the process of formulating R&D strategies.

Suggested Citation

  • Janghyeok Yoon & Hyunseok Park & Kwangsoo Kim, 2013. "Identifying technological competition trends for R&D planning using dynamic patent maps: SAO-based content analysis," Scientometrics, Springer;Akadémiai Kiadó, vol. 94(1), pages 313-331, January.
    • Handle: RePEc:spr:scient:v:94:y:2013:i:1:d:10.1007_s11192-012-0830-6
    DOI: 10.1007/s11192-012-0830-6
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    References listed on IDEAS

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    1. Janghyeok Yoon & Sungchul Choi & Kwangsoo Kim, 2011. "Invention property-function network analysis of patents: a case of silicon-based thin film solar cells," Scientometrics, Springer;Akadémiai Kiadó, vol. 86(3), pages 687-703, March.
    2. Pao-Long Chang & Chao-Chan Wu & Hoang-Jyh Leu, 2010. "Using patent analyses to monitor the technological trends in an emerging field of technology: a case of carbon nanotube field emission display," Scientometrics, Springer;Akadémiai Kiadó, vol. 82(1), pages 5-19, January.
    3. Wanner, Leo & Baeza-Yates, Ricardo & Brügmann, Sören & Codina, Joan & Diallo, Barrou & Escorsa, Enric & Giereth, Mark & Kompatsiaris, Yiannis & Papadopoulos, Symeon & Pianta, Emanuele & Piella, Gemma , 2008. "Towards content-oriented patent document processing," World Patent Information, Elsevier, vol. 30(1), pages 21-33, March.
    4. Sungchul Choi & Janghyeok Yoon & Kwangsoo Kim & Jae Yeol Lee & Cheol-Han Kim, 2011. "SAO network analysis of patents for technology trends identification: a case study of polymer electrolyte membrane technology in proton exchange membrane fuel cells," Scientometrics, Springer;Akadémiai Kiadó, vol. 88(3), pages 863-883, September.
    5. Janghyeok Yoon & Kwangsoo Kim, 2011. "Identifying rapidly evolving technological trends for R&D planning using SAO-based semantic patent networks," Scientometrics, Springer;Akadémiai Kiadó, vol. 88(1), pages 213-228, July.
    6. Janghyeok Yoon & Kwangsoo Kim, 2012. "Detecting signals of new technological opportunities using semantic patent analysis and outlier detection," Scientometrics, Springer;Akadémiai Kiadó, vol. 90(2), pages 445-461, February.
    7. Hyunseok Park & Janghyeok Yoon & Kwangsoo Kim, 2012. "Identifying patent infringement using SAO based semantic technological similarities," Scientometrics, Springer;Akadémiai Kiadó, vol. 90(2), pages 515-529, February.
    8. J. Kruskal, 1964. "Nonmetric multidimensional scaling: A numerical method," Psychometrika, Springer;The Psychometric Society, vol. 29(2), pages 115-129, June.
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