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Estimation of stress-strength reliability for type-1 pathway generated exponential distribution

Author

Listed:
  • V. Gladwin James

    (St. Thomas College (Autonomous), University of Calicut)

  • Sudheep Jose

    (St. Stephen′s College)

  • Thomas Xavier

    (Novartis Healthcare Private Limited)

  • Nicy Sebastian

    (St. Thomas College (Autonomous), University of Calicut)

Abstract

The pathway model provides a versatile framework for generating flexible distribution families, with the type-1 pathway generated exponential model emerging as a special case. This distribution accommodates diverse hazard behaviors including constant, increasing, decreasing, bathtub, and unimodal shapes enabling it to capture complex real world failure rate trends, such as those observed in survival and reliability data. We derive its key statistical properties; survival and hazard functions, moments and likelihood ratio ordering. The stress-strength reliability is developed and its maximum likelihood estimate and asymptotic confidence interval is constructed. An extensive Monte Carlo simulation validates the precision and stability of these methods, while an application to AIDS blood transfusion data demonstrates their practical utility in modeling real life dataset.

Suggested Citation

  • V. Gladwin James & Sudheep Jose & Thomas Xavier & Nicy Sebastian, 2025. "Estimation of stress-strength reliability for type-1 pathway generated exponential distribution," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 16(8), pages 2858-2869, August.
    • Handle: RePEc:spr:ijsaem:v:16:y:2025:i:8:d:10.1007_s13198-025-02845-x
    DOI: 10.1007/s13198-025-02845-x
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