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Perfect X-ray focusing via fitting corrective glasses to aberrated optics

Author

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  • Frank Seiboth

    (Institute of Structural Physics, Technische Universität Dresden
    Present address: Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, 22607 Hamburg, Germany
    Present address: Linac Coherent Light Source, SLAC National Accelerator Laboratory, 2575 Sand Hill Road, Menlo Park, California 94025, USA)

  • Andreas Schropp

    (Deutsches Elektronen-Synchrotron DESY)

  • Maria Scholz

    (Deutsches Elektronen-Synchrotron DESY)

  • Felix Wittwer

    (Institute of Structural Physics, Technische Universität Dresden
    Deutsches Elektronen-Synchrotron DESY)

  • Christian Rödel

    (Institute of Optics and Quantum Electronics, Friedrich-Schiller-Universität Jena
    Linac Coherent Light Source, SLAC National Accelerator Laboratory)

  • Martin Wünsche

    (Institute of Optics and Quantum Electronics, Friedrich-Schiller-Universität Jena)

  • Tobias Ullsperger

    (Institute of Applied Physics, Friedrich-Schiller-Universität Jena)

  • Stefan Nolte

    (Institute of Applied Physics, Friedrich-Schiller-Universität Jena)

  • Jussi Rahomäki

    (KTH Royal Institute of Technology, Biomedical and X-ray Physics, Albanova University Center)

  • Karolis Parfeniukas

    (KTH Royal Institute of Technology, Biomedical and X-ray Physics, Albanova University Center)

  • Stylianos Giakoumidis

    (KTH Royal Institute of Technology, Biomedical and X-ray Physics, Albanova University Center)

  • Ulrich Vogt

    (KTH Royal Institute of Technology, Biomedical and X-ray Physics, Albanova University Center)

  • Ulrich Wagner

    (Diamond Light Source Ltd, Diamond House, Harwell Science and Innovation Campus)

  • Christoph Rau

    (Diamond Light Source Ltd, Diamond House, Harwell Science and Innovation Campus)

  • Ulrike Boesenberg

    (Deutsches Elektronen-Synchrotron DESY)

  • Jan Garrevoet

    (Deutsches Elektronen-Synchrotron DESY)

  • Gerald Falkenberg

    (Deutsches Elektronen-Synchrotron DESY)

  • Eric C. Galtier

    (Linac Coherent Light Source, SLAC National Accelerator Laboratory)

  • Hae Ja Lee

    (Linac Coherent Light Source, SLAC National Accelerator Laboratory)

  • Bob Nagler

    (Linac Coherent Light Source, SLAC National Accelerator Laboratory)

  • Christian G. Schroer

    (Deutsches Elektronen-Synchrotron DESY
    Universität Hamburg)

Abstract

Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today’s technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.

Suggested Citation

  • Frank Seiboth & Andreas Schropp & Maria Scholz & Felix Wittwer & Christian Rödel & Martin Wünsche & Tobias Ullsperger & Stefan Nolte & Jussi Rahomäki & Karolis Parfeniukas & Stylianos Giakoumidis & Ul, 2017. "Perfect X-ray focusing via fitting corrective glasses to aberrated optics," Nature Communications, Nature, vol. 8(1), pages 1-5, April.
  • Handle: RePEc:nat:natcom:v:8:y:2017:i:1:d:10.1038_ncomms14623
    DOI: 10.1038/ncomms14623
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    Cited by:

    1. Adam Kubec & Marie-Christine Zdora & Umut T. Sanli & Ana Diaz & Joan Vila-Comamala & Christian David, 2022. "An achromatic X-ray lens," Nature Communications, Nature, vol. 13(1), pages 1-7, December.
    2. Sissouno, Nada & Boßmann, Florian & Filbir, Frank & Iwen, Mark & Kahnt, Maik & Saab, Rayan & Schroer, Christian & zu Castell, Wolfgang, 2020. "A direct solver for the phase retrieval problem in ptychographic imaging," Mathematics and Computers in Simulation (MATCOM), Elsevier, vol. 176(C), pages 292-300.

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