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Monitoring and maintenance of spares and one shot devices

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  • Newby, Martin

Abstract

Many one shot devices are kept in storage and taken into use when required. This paper examines the deterioration of the devices when in storage. For a complex device limited non-destructive testing and repair is possible short of using it in a destructive test. The tests are not perfect and can give false positive and false negative results. When a fault is indicated a minimal repair is carried out. The objective is to establish levels of reliability of individual components which together with the inspection regime give a particular level of reliability in the delivered components. Assuming a general distribution for the time to fail in storage the likelihood is developed and used to estimate the parameters of the model. The estimated model can then be used to explore different inspection and repair policies.

Suggested Citation

  • Newby, Martin, 2008. "Monitoring and maintenance of spares and one shot devices," Reliability Engineering and System Safety, Elsevier, vol. 93(4), pages 588-594.
    • Handle: RePEc:eee:reensy:v:93:y:2008:i:4:p:588-594
    DOI: 10.1016/j.ress.2007.02.008
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    References listed on IDEAS

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    1. Dean A. Follmann, 1990. "Modelling Failures of Intermittently Used Machines," Journal of the Royal Statistical Society Series C, Royal Statistical Society, vol. 39(1), pages 115-123, March.
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    Cited by:

    1. Cheng, Yao & Elsayed, Elsayed A., 2017. "Reliability modeling of mixtures of one-shot units under thermal cyclic stresses," Reliability Engineering and System Safety, Elsevier, vol. 167(C), pages 58-66.
    2. Cheng, Yao & Elsayed, Elsayed A., 2018. "Reliability modeling and optimization of operational use of one-shot units," Reliability Engineering and System Safety, Elsevier, vol. 176(C), pages 27-36.
    3. Zhao, Qian Qian & Yun, Won Young, 2019. "Storage availability of one-shot system under periodic inspection considering inspection error," Reliability Engineering and System Safety, Elsevier, vol. 186(C), pages 120-133.
    4. Zhu, Xiaojun & Liu, Kai & He, Mu & Balakrishnan, N., 2021. "Reliability estimation for one-shot devices under cyclic accelerated life-testing," Reliability Engineering and System Safety, Elsevier, vol. 212(C).
    5. Balakrishnan, N. & So, H.Y. & Ling, M.H., 2015. "EM algorithm for one-shot device testing with competing risks under exponential distribution," Reliability Engineering and System Safety, Elsevier, vol. 137(C), pages 129-140.
    6. Wu, Shuo-Jye & Hsu, Chu-Chun & Huang, Syuan-Rong, 2020. "Optimal designs and reliability sampling plans for one-shot devices with cost considerations," Reliability Engineering and System Safety, Elsevier, vol. 197(C).
    7. Man-Ho Ling & Narayanaswamy Balakrishnan & Chenxi Yu & Hon Yiu So, 2021. "Inference for One-Shot Devices with Dependent k -Out-of- M Structured Components under Gamma Frailty," Mathematics, MDPI, vol. 9(23), pages 1-24, November.

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