IDEAS home Printed from https://ideas.repec.org/a/eee/reensy/v265y2026ipas095183202500701x.html
   My bibliography  Save this article

Hybrid stochastic process-based reliability modeling considering two-phase dependence degradation patterns

Author

Listed:
  • Gao, Hongda
  • Yin, Zicheng
  • Li, Yan
  • Qiu, Qingan

Abstract

Reliability modeling based on stochastic processes is an efficient approach to explore the internal degradation principle and random fluctuation of complex systems. Degradation models may transform when phase shifts occur, primarily due to changes in degradation mechanisms and environmental fluctuations. Motivated by the observed phenomena, we developed two hybrid degradation models with constant and random transition points. Specifically, Model 1 employs a Wiener process in the first phase and a Gamma process in the second phase, whereas, Model 2 reverses the order of the two kinds of stochastic process. Both the constant and random transition points are incorporated into the two models to account for the two-phase characteristic caused by the influence of the internal aging law and external environments, such as the cumulative effect of shocks. The system experiences a shock process where the shock effect is novel instantiated in that the shock damage could be absorbed in the first phase. In the second phase, however, the degradation increment will occur. Then, the system reliability is obtained for Model 1 and the simulation approach is applied in Model 2. Finally, some examples are shown to verify the models.

Suggested Citation

  • Gao, Hongda & Yin, Zicheng & Li, Yan & Qiu, Qingan, 2026. "Hybrid stochastic process-based reliability modeling considering two-phase dependence degradation patterns," Reliability Engineering and System Safety, Elsevier, vol. 265(PA).
  • Handle: RePEc:eee:reensy:v:265:y:2026:i:pa:s095183202500701x
    DOI: 10.1016/j.ress.2025.111501
    as

    Download full text from publisher

    File URL: http://www.sciencedirect.com/science/article/pii/S095183202500701X
    Download Restriction: Full text for ScienceDirect subscribers only

    File URL: https://libkey.io/10.1016/j.ress.2025.111501?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to

    for a different version of it.

    More about this item

    Keywords

    ;
    ;
    ;
    ;
    ;

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:reensy:v:265:y:2026:i:pa:s095183202500701x. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Catherine Liu (email available below). General contact details of provider: https://www.journals.elsevier.com/reliability-engineering-and-system-safety .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.