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Structural complexity of disordered surfaces: Analyzing the porous silicon SFM patterns

Author

Listed:
  • Rosa, R.R.
  • Baroni, M.P.M.A.
  • Zaniboni, G.T.
  • Ferreira da Silva, A.
  • Roman, L.S.
  • Pontes, J.
  • Bolzan, M.J.A.

Abstract

This paper introduces a relative structural complexity measure for the characterization of disordered surfaces. Numerical solutions of 2d+1 KPZ equation and scanning force microscopy (SFM) patterns of porous silicon samples are analyzed using this methodology. The results and phenomenological interpretation indicate that the proposed measure is efficient for quantitatively characterize the structural complexity of disordered surfaces (and interfaces) observed and/or simulated in nano, micro and ordinary scales.

Suggested Citation

  • Rosa, R.R. & Baroni, M.P.M.A. & Zaniboni, G.T. & Ferreira da Silva, A. & Roman, L.S. & Pontes, J. & Bolzan, M.J.A., 2007. "Structural complexity of disordered surfaces: Analyzing the porous silicon SFM patterns," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 386(2), pages 666-673.
  • Handle: RePEc:eee:phsmap:v:386:y:2007:i:2:p:666-673
    DOI: 10.1016/j.physa.2007.08.044
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