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Optical and microwave properties of metal-insulator thin films: possibility of light localization

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  • Sarychev, Andrey K.
  • Bergman, David J.
  • Yagil, Yoad

Abstract

High frequency response (optical, infrared and microwave) of thin metal-dielectric inhomogeneous films is studied. We propose a new approach based on a direct solution of Maxwell's equations without having to invoke the quasi-static approximation. Our theory reproduces most of the known experimental results including the anomalous absorption near a percolation threshold. For the strong skin effect case or for superconducting-dielectric films we predict an electromagnetic wave localisation at the percolation threshold.

Suggested Citation

  • Sarychev, Andrey K. & Bergman, David J. & Yagil, Yoad, 1994. "Optical and microwave properties of metal-insulator thin films: possibility of light localization," Physica A: Statistical Mechanics and its Applications, Elsevier, vol. 207(1), pages 372-378.
    • Handle: RePEc:eee:phsmap:v:207:y:1994:i:1:p:372-378
    DOI: 10.1016/0378-4371(94)90398-0
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