IDEAS home Printed from https://ideas.repec.org/a/eee/cysrev/v73y2017icp9-14.html
   My bibliography  Save this article

Differences between risk factors for truancy and delinquency in Dutch adolescents

Author

Listed:
  • van der Woude, Laurine B.
  • van der Stouwe, Trudy
  • Stams, Geert Jan J.M.

Abstract

The present study examined differences in risk factors for truancy and delinquency. Research questions were: (1) Which risk factors are significantly different between truants and delinquents? (2) Which risk factors make the strongest distinction between truancy and delinquency? Participants were Dutch adolescents (N=365) who received a penal sanction in the Netherlands. 83% (n=304) of them had violated the penal law, and 17% (n=62) received the penalty for truancy. Differences in risk factors for truancy and delinquency were found for age and parental punishment. Binary logistic regression showed that only parental punishment retained its predictive effects when controlling for other differences. Truants experienced more parental punishment than delinquent adolescents. The present study shows that addressing dysfunctional home circumstances could be more important for truants, indicating that existing interventions do not differentiate enough between truants and delinquents.

Suggested Citation

  • van der Woude, Laurine B. & van der Stouwe, Trudy & Stams, Geert Jan J.M., 2017. "Differences between risk factors for truancy and delinquency in Dutch adolescents," Children and Youth Services Review, Elsevier, vol. 73(C), pages 9-14.
  • Handle: RePEc:eee:cysrev:v:73:y:2017:i:c:p:9-14
    DOI: 10.1016/j.childyouth.2016.11.028
    as

    Download full text from publisher

    File URL: http://www.sciencedirect.com/science/article/pii/S0190740916304728
    Download Restriction: Full text for ScienceDirect subscribers only

    File URL: https://libkey.io/10.1016/j.childyouth.2016.11.028?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Skedgell, Kyleigh & Kearney, Christopher A., 2018. "Predictors of school absenteeism severity at multiple levels: A classification and regression tree analysis," Children and Youth Services Review, Elsevier, vol. 86(C), pages 236-245.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:cysrev:v:73:y:2017:i:c:p:9-14. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Catherine Liu (email available below). General contact details of provider: http://www.elsevier.com/locate/childyouth .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.