IDEAS home Printed from https://ideas.repec.org/a/eee/csdana/v50y2006i6p1418-1440.html
   My bibliography  Save this article

Tests of fit for the three-parameter lognormal distribution

Author

Listed:
  • Chen, Colin

Abstract

No abstract is available for this item.

Suggested Citation

  • Chen, Colin, 2006. "Tests of fit for the three-parameter lognormal distribution," Computational Statistics & Data Analysis, Elsevier, vol. 50(6), pages 1418-1440, March.
  • Handle: RePEc:eee:csdana:v:50:y:2006:i:6:p:1418-1440
    as

    Download full text from publisher

    File URL: http://www.sciencedirect.com/science/article/pii/S0167-9473(05)00027-7
    Download Restriction: Full text for ScienceDirect subscribers only.
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    Citations

    Citations are extracted by the CitEc Project, subscribe to its RSS feed for this item.
    as


    Cited by:

    1. Ajinkya Shirurkar & Yogesh Patil & D. Davidson Jebaseelan, 2019. "Reliability improvement of fork biasing spring in MCCB mechanism," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 10(4), pages 491-498, August.
    2. Santosh B. Rane & Yahya A.M. Narvel & Niloy Khatua, 2017. "Development of mechanism for mounting secondary isolating contacts (SICs) in air circuit breakers (ACBs) with high operational reliability," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 8(2), pages 1816-1831, November.
    3. Santosh B. Rane & Yahya A. M. Narvel, 2016. "Reliability assessment and improvement of air circuit breaker (ACB) mechanism by identifying and eliminating the root causes," International Journal of System Assurance Engineering and Management, Springer;The Society for Reliability, Engineering Quality and Operations Management (SREQOM),India, and Division of Operation and Maintenance, Lulea University of Technology, Sweden, vol. 7(1), pages 305-321, December.
    4. Kim, Jin Seon & Yum, Bong-Jin, 2008. "Selection between Weibull and lognormal distributions: A comparative simulation study," Computational Statistics & Data Analysis, Elsevier, vol. 53(2), pages 477-485, December.

    More about this item

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:eee:csdana:v:50:y:2006:i:6:p:1418-1440. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Catherine Liu (email available below). General contact details of provider: http://www.elsevier.com/locate/csda .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.