A Comparison between US and International Patent Classification as Input Data of a Technology Competition-Oriented Cluster Analysis
In a framework of a multivariate analysis of patent data this study applies a method of defining and analysing technology-based clusters of companies with the help of patent classification. In addition to the utilization of US patent classification we compare the results of a second analysis using the international patent classification. It is shown that the international patent classification is appropriate to conduct technology-oriented competition analyses, as long as a preparatory work of experts foregoes which classifies single classification symbols to technology fields as detailed as necessary to meet the demands of the individual analysis.
|Date of creation:||25 Nov 2005|
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- Reinhard Haupt, 2005. "Patent analysis of a companys technology strength," Jenaer Schriften zur Wirtschaftswissenschaft 01/2005, Friedrich-Schiller-Universität Jena, Wirtschaftswissenschaftliche Fakultät.
- Basberg, Bjorn L., 1987. "Patents and the measurement of technological change: A survey of the literature," Research Policy, Elsevier, vol. 16(2-4), pages 131-141, August.
- Paola Criscuolo, 2003. "Reverse Technology Transfer: A Patent Citation Analysis of the European Chemical and Pharmaceutical Sectors," SPRU Working Paper Series 107, SPRU - Science and Technology Policy Research, University of Sussex.
- Jaffe, Adam B., 1989. "Characterizing the "technological position" of firms, with application to quantifying technological opportunity and research spillovers," Research Policy, Elsevier, vol. 18(2), pages 87-97, April.
- Engelsman, E. C. & van Raan, A. F. J., 1994. "A patent-based cartography of technology," Research Policy, Elsevier, vol. 23(1), pages 1-26, January.
- Dominique Guellec & Bruno Van Pottelsberghe de la Potterie, 2002.
"The Value of Patents and Patenting Strategies: Countries and Technology Areas Patterns,"
Economics of Innovation and New Technology,
Taylor & Francis Journals, vol. 11(2), pages 133-148.
- Bruno Van Pottelsberghe & Dominique Guellec, 2002. "The value of patents and patenting strategies: countries and technology areas patterns," ULB Institutional Repository 2013/6217, ULB -- Universite Libre de Bruxelles.
- Patel, Pari & Pavitt, Keith, 1997. "The technological competencies of the world's largest firms: Complex and path-dependent, but not much variety," Research Policy, Elsevier, vol. 26(2), pages 141-156, May.
- Lionel Nesta & Pier Paolo Saviotti, 2005. "COHERENCE OF THE KNOWLEDGE BASE AND THE FIRM'S INNOVATIVE PERFORMANCE: EVIDENCE FROM THE U.S. PHARMACEUTICAL INDUSTRY -super-* ," Journal of Industrial Economics, Wiley Blackwell, vol. 53(1), pages 123-142, 03.
- Maurseth, Per Botolf & Verspagen, Bart, 2002. " Knowledge Spillovers in Europe: A Patent Citations Analysis," Scandinavian Journal of Economics, Wiley Blackwell, vol. 104(4), pages 531-45, December.
- Criscuolo,Paola, 2002. "Reverse Technology Transfer: A Patent Citation Analysis of the European Chemical and Pharmaceutical sectors," Research Memorandum 036, Maastricht University, Maastricht Economic Research Institute on Innovation and Technology (MERIT).
- Narin, Francis & Noma, Elliot & Perry, Ross, 1987. "Patents as indicators of corporate technological strength," Research Policy, Elsevier, vol. 16(2-4), pages 143-155, August.
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