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Measurement equivalence of the dispositional resistance to change scale

Author

Listed:
  • Shaul Oreg

    (Ǧāmiʿat͏̈ Hayfā = University of Haifa)

  • Mahmut Bayazit

    (Sabanci University [Istanbul])

  • Maria Vakola

    (AUEB - Athens University of Economics and Business)

  • Luis Arciniega

    (ITAM - Instituto Tecnológico Autónomo de México)

  • Achilles Armenakis

    (AU - Auburn University)

  • Rasa Barkauskiene

    (Vilnius University [Vilnius])

  • Nikos Bozionelos

    (AUEB - Athens University of Economics and Business)

  • Yuka Fujimoto

    (Deakin University [Burwood])

  • Luis González

    (Universidad de Salamanca [España] = University of Salamanca [Spain])

  • Jian Han

    (CEIBS - China Europe International Business School)

  • Martina Hřebíčková

    (UK - Univerzita Karlova [Praha, Česká republika] = Charles University [Prague, Czech Republic])

  • Nerina Jimmieson

    (UQ [All campuses : Brisbane, Dutton Park Gatton, Herston, St Lucia and other locations] - The University of Queensland)

  • Jana Kordačová

    (SAS - Slovak Academy of Sciences)

  • Hitoshi Mitsuhashi

    (Keiō Gijuku Daigaku = Keio University [Tokyo])

  • Boris Mlačić

    (University of Zagreb)

  • Ivana Ferić

    (University of Zagreb)

  • Marina Kotrla Topić

    (University of Zagreb, Institute of Social Sciences Ivo Pilar)

  • Sandra Ohly

    (Goethe University Frankfurt)

  • Per Øystein Saksvik

    (NTNU - Norwegian University of Science and Technology)

  • Hilde Hetland

    (UiB - University of Bergen)

  • Ingvild Saksvik

    (UiB - University of Bergen)

  • Karen van Dam

    (Tilburg University [Tilburg] - Netspar)

Abstract

No abstract is available for this item.

Suggested Citation

  • Shaul Oreg & Mahmut Bayazit & Maria Vakola & Luis Arciniega & Achilles Armenakis & Rasa Barkauskiene & Nikos Bozionelos & Yuka Fujimoto & Luis González & Jian Han & Martina Hřebíčková & Nerina Jimmies, 2018. "Measurement equivalence of the dispositional resistance to change scale," Post-Print hal-02311099, HAL.
    • Handle: RePEc:hal:journl:hal-02311099
    DOI: 10.1037/0021-9010.93.4.935
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