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Planning Repeated Degradation Testing for Degrading Products

In: Data-Driven Remaining Useful Life Prognosis Techniques

Author

Listed:
  • Xiao-Sheng Si

    (Xi’an Institute of High-Technology)

  • Zheng-Xin Zhang

    (Xi’an Institute of High-Technology)

  • Chang-Hua Hu

    (Xi’an Institute of High-Technology)

Abstract

Degradation information regarding the system’s health state, especially from highly reliable items, has been a useful alternative for the system’s remaining useful life (RUL) estimation, as well as a valuable basis for condition based maintenance (CBM). Once the degradation information of a system is available by the degradation test, one well-recognized method is to establish a stochastic degradation model to predict the distributions of the future degradation and the associated lifetime, based on the relationship between the degradation and failure time.

Suggested Citation

  • Xiao-Sheng Si & Zheng-Xin Zhang & Chang-Hua Hu, 2017. "Planning Repeated Degradation Testing for Degrading Products," Springer Series in Reliability Engineering, in: Data-Driven Remaining Useful Life Prognosis Techniques, chapter 0, pages 23-37, Springer.
    • Handle: RePEc:spr:ssrchp:978-3-662-54030-5_2
    DOI: 10.1007/978-3-662-54030-5_2
    as

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