IDEAS home Printed from https://ideas.repec.org/h/spr/ssrchp/978-3-319-52425-2_3.html
   My bibliography  Save this book chapter

Global Buckling Reliability Analysis of Slender Network Arch Bridges: An Application of Monte Carlo-Based Estimation by Optimized Fitting

In: Risk and Reliability Analysis: Theory and Applications

Author

Listed:
  • Anders Rønnquist

    (Norwegian University of Science and Technology)

  • Arvid Naess

    (Norwegian University of Science and Technology)

Abstract

Network arch bridges are extremely slender bridge structures with a very efficient load-carrying structure. This configuration can carry loads that are several times greater than traditional tied-arch bridges with vertical hangers. These bridges are seen as an attractive structure due to their slenderness, which potentially also make them vulnerable to global system buckling. Thus, the buckling reliability of network arch bridges is here further investigated with emphasis on geometric and load uncertainties. In principle, the reliability of structural systems can be accurately predicted by standard Monte Carlo simulation. This method has several attractive features for structural system reliability. One is that the system failure criterion is easy to control, almost irrespective of the complexity of the system. However, the computational cost involved may be prohibitive for highly reliable structural systems if standard Monte Carlo simulation is used. In this chapter a recently developed enhanced Monte Carlo method has been applied for calculating the reliability. This method drastically reduced the computational burden of the standard Monte Carlo approach and thereby made it practically feasible to estimate the reliability of the bridge against buckling.

Suggested Citation

  • Anders Rønnquist & Arvid Naess, 2017. "Global Buckling Reliability Analysis of Slender Network Arch Bridges: An Application of Monte Carlo-Based Estimation by Optimized Fitting," Springer Series in Reliability Engineering, in: Paolo Gardoni (ed.), Risk and Reliability Analysis: Theory and Applications, pages 47-66, Springer.
    • Handle: RePEc:spr:ssrchp:978-3-319-52425-2_3
    DOI: 10.1007/978-3-319-52425-2_3
    as

    Download full text from publisher

    To our knowledge, this item is not available for download. To find whether it is available, there are three options:
    1. Check below whether another version of this item is available online.
    2. Check on the provider's web page whether it is in fact available.
    3. Perform a search for a similarly titled item that would be available.

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:spr:ssrchp:978-3-319-52425-2_3. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Sonal Shukla or Springer Nature Abstracting and Indexing (email available below). General contact details of provider: http://www.springer.com .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.