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Research on Internal Stress Damage Detection Strategies for Optical Components

Author

Listed:
  • Chendong Lei

    (National University of Defense Technology, College of Intelligence Science and Technology
    National University of Defense Technology, National Key Laboratory of Equipment State Sensing and Smart Support)

  • Peng Yang

    (National University of Defense Technology, College of Intelligence Science and Technology
    National University of Defense Technology, National Key Laboratory of Equipment State Sensing and Smart Support)

  • Xinyu Luo

    (National University of Defense Technology, College of Intelligence Science and Technology
    National University of Defense Technology, National Key Laboratory of Equipment State Sensing and Smart Support)

  • Han Yu

    (National University of Defense Technology, College of Intelligence Science and Technology)

  • Guanjun Liu

    (National University of Defense Technology, College of Intelligence Science and Technology
    National University of Defense Technology, National Key Laboratory of Equipment State Sensing and Smart Support)

Abstract

Recent research in optical systems indicates a trend toward increasingly complex architectures, extreme dimensional requirements, and elevated performance standards. Consequently, optical components are expected to satisfy more rigorous functional and structural criteria. While traditional fabrication methods have predominantly emphasized surface quality and form accuracy, the evolution of internal stresses during both manufacturing and operational phases exerts a substantial influence on processing outcomes and damage mechanisms. Therefore, the accurate detection and evaluation of residual stress have become essential for enabling high-performance optical fabrication and for enhancing the operational longevity of optical components.

Suggested Citation

  • Chendong Lei & Peng Yang & Xinyu Luo & Han Yu & Guanjun Liu, 2026. "Research on Internal Stress Damage Detection Strategies for Optical Components," Springer Series in Reliability Engineering,, Springer.
    • Handle: RePEc:spr:ssrchp:978-3-032-22873-4_35
    DOI: 10.1007/978-3-032-22873-4_35
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