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Considering Multiplicative Noise in a Software Reliability Growth Model Using Stochastic Differential Equation Approach

Author

Listed:
  • Kuldeep Chaudhary

    (Amity Institute of Applied Sciences, Amity University)

  • Vijay Kumar

    (Amity Institute of Applied Sciences, Amity University)

  • Deepansha Kumar

    (Amity Institute of Applied Sciences, Amity University)

  • Pradeep Kumar

    (Amity Institute of Applied Sciences, Amity University)

Abstract

A Software reliability growth models are very useful to investigate software reliability characteristics quantitatively and to establish relationship between the remaining faults in the software with testing time. The only way to enhance the quality and reliability of software is to detect and remove the faults during the testing phase of software. Usually, the fault removal process is assumed to be deterministic, but as software systems get bigger and more flaws are found during testing, the number of faults that are found and removed during each debugging process decreases until it is negligibly small compared to the fault content at the beginning of the testing phase. It is quite likely that software fault detection process in this scenario as a stochastic process with continuous state space. In this study, we have the concept of multiplicative noise and proposed a software reliability growth model under perfect debugging environments which is governed by stochastic differential equations. The proposed stochastic differential equation based SRGM has been validated on real-life failure data sets, and the results of the goodness of fit and comparison criteria for the proposed model exhibited the applicability of the model.

Suggested Citation

  • Kuldeep Chaudhary & Vijay Kumar & Deepansha Kumar & Pradeep Kumar, 2024. "Considering Multiplicative Noise in a Software Reliability Growth Model Using Stochastic Differential Equation Approach," Springer Series in Reliability Engineering,, Springer.
    • Handle: RePEc:spr:ssrchp:978-3-031-55048-5_16
    DOI: 10.1007/978-3-031-55048-5_16
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