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Recycling of Noble Metals Used in Memory Packaging

In: Interconnect Reliability in Advanced Memory Device Packaging

Author

Listed:
  • Chong Leong, Gan

    (Micron Memory Taiwan Co. Ltd.)

  • Chen-Yu, Huang

    (Micron Memory Taiwan Co. Ltd.)

Abstract

This Chapter provides an overview of current and future deployment of recycling some noble metals on interconnect metals used in semiconductor assembly and packaging. Also, with the aim to study the key technical barriers, challenges of deployment and its reliability performance of both recycled gold (Au) and recycled copper (Cu) in semiconductor device packaging. This paper lays out the importance of ensuring noble metals in terms of its materials sustainability for the next decade. This article briefly reviews key aspects of deployment of recycled Au wire, recycled Cu, and other noble metals in semiconductor packaging and assembly. List of key technical challenges have been covered in this paper. The research trends on Sustainable Development Goal (SDG) technological and materials aspects highlight the critical role of recycling noble metals technology in semiconductor industry. At the end of this chapter, summary and key recommendation of future works have been provided for better clarity and reference purposes.

Suggested Citation

  • Chong Leong, Gan & Chen-Yu, Huang, 2023. "Recycling of Noble Metals Used in Memory Packaging," Springer Series in Reliability Engineering, in: Interconnect Reliability in Advanced Memory Device Packaging, chapter 0, pages 45-66, Springer.
  • Handle: RePEc:spr:ssrchp:978-3-031-26708-6_3
    DOI: 10.1007/978-3-031-26708-6_3
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