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On the Reliability of Computing-in-Memory Accelerators for Deep Neural Networks

In: System Dependability and Analytics

Author

Listed:
  • Zheyu Yan

    (University of Notre Dame)

  • Xiaobo Sharon Hu

    (University of Notre Dame)

  • Yiyu Shi

    (University of Notre Dame)

Abstract

Computing-in-memory with emerging non-volatile memory (nvCiM) is shown to be a promising candidate for accelerating deep neural networks (DNNs) with high energy efficiency. However, most non-volatile memory (NVM) devices suffer from reliability issues, resulting in a difference between actual data involved in the nvCiM computation and the weight value trained in the data center. Thus, models actually deployed on nvCiM platforms achieve lower accuracy than their counterparts trained on the conventional hardware (e.g., GPUs). In this chapter, we first offer a brief introduction to the opportunities and challenges of nvCiM DNN accelerators and then show the properties of different types of NVM devices. We then introduce the general architecture of nvCiM DNN accelerators. After that, we discuss the source of unreliability and how to efficiently model their impact. Finally, we introduce representative works that mitigate the impact of device variations.

Suggested Citation

  • Zheyu Yan & Xiaobo Sharon Hu & Yiyu Shi, 2023. "On the Reliability of Computing-in-Memory Accelerators for Deep Neural Networks," Springer Series in Reliability Engineering, in: Long Wang & Karthik Pattabiraman & Catello Di Martino & Arjun Athreya & Saurabh Bagchi (ed.), System Dependability and Analytics, pages 167-190, Springer.
    • Handle: RePEc:spr:ssrchp:978-3-031-02063-6_9
    DOI: 10.1007/978-3-031-02063-6_9
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