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Classification Based Reliability Growth Prediction on Data Generated by Multiple Independent Processes

In: Proceedings of the International Conference on Managing the Asian Century

Author

Listed:
  • Vishwas M Bhat

    (Birla Institute of Technology and Sciences)

  • Rajesh P Mishra

    (Birla Institute of Technology and Sciences)

  • Sainarayanan Sundarakrishna

    (Engineering Design Center India)

  • Ayon Chakraborty

    (James Cook University Singapore)

Abstract

Reliability Growth is a modeling process for product quality characterization over the lifespan for both hardware and software products and has been explained by multiple models like Duane, Crow-AMSAA, Lloyd Lipow etc. Our research proposes a framework for case-based/scenario based model estimation and prediction, by supervised learning of historical data. In this proposed framework, the case base is generated from historical data and Crow Model is applied in a novel sense to extract information from the historically labeled occurrences. With our framework, we draw in a comparative advantage over the traditional predictive modeling using a Crow’s Growth Model.

Suggested Citation

  • Vishwas M Bhat & Rajesh P Mishra & Sainarayanan Sundarakrishna & Ayon Chakraborty, 2013. "Classification Based Reliability Growth Prediction on Data Generated by Multiple Independent Processes," Springer Books, in: Purnendu Mandal (ed.), Proceedings of the International Conference on Managing the Asian Century, edition 127, chapter 48, pages 429-439, Springer.
    • Handle: RePEc:spr:sprchp:978-981-4560-61-0_48
    DOI: 10.1007/978-981-4560-61-0_48
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