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Identification of Conductivity Distribution in a Au-Al Junction for Application to Integrated Circuits

In: Optimization and Inverse Problems in Electromagnetism

Author

Listed:
  • Alessandro Bramanti

    (University of Pavia, Department of Electrical Engineering)

  • Paolo Di Barba

    (University of Pavia, Department of Electrical Engineering)

  • Antonio Savini

    (University of Pavia, Department of Electrical Engineering)

  • Umberto Anselmi Tamburini

    (University of Pavia, Department of Physical Chemistry)

  • Filippo Maglia

    (University of Pavia, Department of Physical Chemistry)

Abstract

The junction between Au and Al in a current-carrying contact for application to integrated circuits is considered. The conductivity of the compound is identified by means of a field-inversion technique. The simulation of the growth process of the Au-Al compound relies on the transient field analysis of the current flow through the junction. Results of the identification are compared with measurements.

Suggested Citation

  • Alessandro Bramanti & Paolo Di Barba & Antonio Savini & Umberto Anselmi Tamburini & Filippo Maglia, 2003. "Identification of Conductivity Distribution in a Au-Al Junction for Application to Integrated Circuits," Springer Books, in: Marek Rudnicki & Sławomir Wiak (ed.), Optimization and Inverse Problems in Electromagnetism, pages 223-231, Springer.
    • Handle: RePEc:spr:sprchp:978-94-017-2494-4_22
    DOI: 10.1007/978-94-017-2494-4_22
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