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Shape of a Distribution Through the L2-Wasserstein Distance

In: Distributions With Given Marginals and Statistical Modelling

Author

Listed:
  • Juan A. Cuesta-Albertos

    (Universidad de Cantabria, Departamento de Matemáticas)

  • Carlos Matrán Bea

    (Universidad de Valladolid, Departamento de Estadística e I.O.)

  • Jesús M. Rodríguez Rodríguez

    (Universidad de Valladolid, Departamento de Estadística e I.O.)

Abstract

Abstract Let Q be a probability measure on ℝ d and let ℑ be a family of probability measures on ℝ d which will be considered as a pattern. For suitable patterns we consider the closest law to Q in ℑ, through the L2-Wasserstein distance, as a descriptive measure associated to Q. The distance between Q and ℑ is a natural measure of the fit of Q to the pattern. We analyze this approach via the consideration of different patterns. Some of them generalize usual location and dispersion measures. Special attention will be paid to patterns based on uniform distributions on suitable families of sets, like the intervals in the unidimensional case (which allows us to analyze the flatness of the one-dimensional distributions) or the ellipsoids for the multivariate distributions.

Suggested Citation

  • Juan A. Cuesta-Albertos & Carlos Matrán Bea & Jesús M. Rodríguez Rodríguez, 2002. "Shape of a Distribution Through the L2-Wasserstein Distance," Springer Books, in: Carles M. Cuadras & Josep Fortiana & José A. Rodriguez-Lallena (ed.), Distributions With Given Marginals and Statistical Modelling, pages 51-61, Springer.
  • Handle: RePEc:spr:sprchp:978-94-017-0061-0_7
    DOI: 10.1007/978-94-017-0061-0_7
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