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Control Charting Normal Variance – Reflections, Curiosities, and Recommendations

In: Frontiers in Statistical Quality Control 9

Author

Listed:
  • Sven Knoth

    (Engineering, Advanced Mask Technology Center†, Engineering)

Abstract

Summary Following an idea of Box, Hunter & Hunter (1978), the consideration of the log of the sample variance S2 became quite popular in SPC literature concerned with variance monitoring. The sample standard deviation S and the range R are the most common statistics in daily SPC practice. SPC software packages that are used in semiconductor industry offer exclusively R and S control charts. With Castagliola (2005) one new log based transformation started in 2005. Again, the search for symmetry and quasi-normality served as reason to look for a new chart statistic. Symmetry of the chart statistic could help in setting up two-sided control charts. Here, a comparison study is done that looks especially to the two-sided setup, straightens out the view of the available set of competing statistics used for variance monitoring and, eventually, leads to recommendations that could be given in order to choose the right statistic.

Suggested Citation

  • Sven Knoth, 2010. "Control Charting Normal Variance – Reflections, Curiosities, and Recommendations," Springer Books, in: Hans-Joachim Lenz & Peter-Theodor Wilrich & Wolfgang Schmid (ed.), Frontiers in Statistical Quality Control 9, pages 3-18, Springer.
    • Handle: RePEc:spr:sprchp:978-3-7908-2380-6_1
    DOI: 10.1007/978-3-7908-2380-6_1
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