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Measurement of Paint Layer Thickness with Photothermal Infrared Radiometry

In: Mathematics — Key Technology for the Future

Author

Listed:
  • A. K. Louis

    (Institut für Angewandte Mathematik, Universität des Saarlandes)

  • P. Dörr

    (Institut für Angewandte Mathematik, Universität des Saarlandes)

  • C. Gruss

    (Phototherm Dr. Petry GmbH)

  • H. Petry

    (Phototherm Dr. Petry GmbH)

Abstract

Photothermal infrared radiometry has been used for the measurement of thermo-physical, optical and geometrical properties of multi-layered samples of paint on a metalic substrate. A special data-normalization is applied to reduce the number of sensitive parameters which makes the identification task for the remaining parameters easier. The normalization stabilizes the evaluation of the photothermal signal and makes the infrared radiometry more attractive for applications in the industrial environment. It is shown that modelling and multi-parameter- fitting can be applied successfully to the normalized data for the determination of layer thicknesses. A second approach is presented to verify the adaptability of reconstruction algorithms for thickness measurements. An algorithm which uses the affinity of the thermal waves to the acoustic waves and the inverse scattering problem demonstrates the applicability in general.

Suggested Citation

  • A. K. Louis & P. Dörr & C. Gruss & H. Petry, 2003. "Measurement of Paint Layer Thickness with Photothermal Infrared Radiometry," Springer Books, in: Willi Jäger & Hans-Joachim Krebs (ed.), Mathematics — Key Technology for the Future, pages 460-471, Springer.
    • Handle: RePEc:spr:sprchp:978-3-642-55753-8_37
    DOI: 10.1007/978-3-642-55753-8_37
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