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Electrical Breakdown and the Breakdown Formalism

In: Fiber Bundles

Author

Listed:
  • James U. Gleaton

  • David Han

    (University of Texas at San Antonio, Management of Science and Statistics)

  • James D. Lynch

    (University of South Carolina, Department of Statistics)

  • Hon Keung Tony Ng

    (Bentley University, Department of Mathematical Sciences)

  • Fabrizio Ruggeri

    (Consiglio Nazionale delle Ricerche, Istituto di Matematica Applicata e Tecnologie Informatiche)

Abstract

In the testing of capacitors and capacitor circuits, one is interested in their reliability. Thus, one studies various types of breakdowns under accelerated stress conditions: e.g., stressed under increasing voltage or current to determine voltage or current breakdown (VBD or CBD) and time to failure under static voltage or current load or cycles to failure. The BD formalism allows one to relate BD under different testing protocols and to project the reliability to normal operating conditions.

Suggested Citation

  • James U. Gleaton & David Han & James D. Lynch & Hon Keung Tony Ng & Fabrizio Ruggeri, 2022. "Electrical Breakdown and the Breakdown Formalism," Springer Books, in: Fiber Bundles, chapter 0, pages 59-63, Springer.
    • Handle: RePEc:spr:sprchp:978-3-031-14797-5_5
    DOI: 10.1007/978-3-031-14797-5_5
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