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Introduction to Statistics and Probability

In: Introduction to Statistics in Metrology

Author

Listed:
  • Stephen Crowder

    (Sandia National Laboratories)

  • Collin Delker

    (Sandia National Laboratories)

  • Eric Forrest

    (Sandia National Laboratories)

  • Nevin Martin

    (Sandia National Laboratories)

Abstract

This chapter provides an overview of statistics and probability concepts that are used in metrology. It begins with a discussion on data types along with Exploratory Data Analysis techniques that can be used to help understand and visualize data. It then gives an overview of probability distributions common to metrology with guidance on choosing probability distributions based on available information. This chapter concludes with information on estimating parameters and assessing goodness-of-fit of probability models.

Suggested Citation

  • Stephen Crowder & Collin Delker & Eric Forrest & Nevin Martin, 2020. "Introduction to Statistics and Probability," Springer Books, in: Introduction to Statistics in Metrology, chapter 0, pages 59-80, Springer.
    • Handle: RePEc:spr:sprchp:978-3-030-53329-8_4
    DOI: 10.1007/978-3-030-53329-8_4
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