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Special Topics in Metrology

In: Introduction to Statistics in Metrology

Author

Listed:
  • Stephen Crowder

    (Sandia National Laboratories)

  • Collin Delker

    (Sandia National Laboratories)

  • Eric Forrest

    (Sandia National Laboratories)

  • Nevin Martin

    (Sandia National Laboratories)

Abstract

Metrology guides such as the JCGM 100 and JCGM 101 present in detail the most commonly used methods for evaluating measurement uncertainty. Additional guides for less commonly used methods are in development. In this chapter we present an overview of methods that we find valuable and deserving of more coverage. These methods include statistical process control (SPC), binary measurement systems (BMS), destructive measurements, sample size determination, and Bayesian analysis in metrology.

Suggested Citation

  • Stephen Crowder & Collin Delker & Eric Forrest & Nevin Martin, 2020. "Special Topics in Metrology," Springer Books, in: Introduction to Statistics in Metrology, chapter 0, pages 267-302, Springer.
    • Handle: RePEc:spr:sprchp:978-3-030-53329-8_11
    DOI: 10.1007/978-3-030-53329-8_11
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