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Burn-in at the Component and System Level

In: Lifetime Data: Models in Reliability and Survival Analysis

Author

Listed:
  • Henry W. Block

    (University of Pittsburgh, Department of Mathematics and Statistics)

  • Jie Mi

    (Florida International University, Department of Statistics)

  • Thomas H. Savits

    (University of Pittsburgh, Department of Mathematics and Statistics)

Abstract

A variety of engineering systems are assembled from components which have been “burned-in.” That is, the components have been tested, possibly under accelerated stresses, to remove weak items. Components surviving this test period are said to have been burned-in. Often this burn-in procedure is applied to systems. Under certain standard assumptions and various criteria, it is shown that a system burn-in is unnecessary, i.e., effective component burn-in precludes system burn-in.

Suggested Citation

  • Henry W. Block & Jie Mi & Thomas H. Savits, 1996. "Burn-in at the Component and System Level," Springer Books, in: Nicholas P. Jewell & Alan C. Kimber & Mei-Ling Ting Lee & G. A. Whitmore (ed.), Lifetime Data: Models in Reliability and Survival Analysis, pages 53-57, Springer.
    • Handle: RePEc:spr:sprchp:978-1-4757-5654-8_8
    DOI: 10.1007/978-1-4757-5654-8_8
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