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Self-repair Measurement in FPGA-Based Partial Reconfigurable Systems

In: Sustainability in Software Engineering and Business Information Management

Author

Listed:
  • Mohamed Sedik Chebout

    (University of Oum El Bouaghi)

  • Toufik Marir

    (University of Oum El Bouaghi)

  • Farid Mokhati

    (University of Oum El Bouaghi)

Abstract

Intelligent Embedded Systems (IES) represent a new discipline in which Artificial Intelligence (AI) is coupled with Embedded Systems (ESs) in order to create a new self-X-based Embedded Systems generation. Self-X capabilities, like: self-repair, self-awareness, self-adaptation, etc. brought, for an ES, the ability to reason about their external environments and, as a result, adapt their behavior appropriately. Also, self-repair capability defines the fact of identifying and repairing failures in order to avoid the high cost of the ordinary repair process. FPGA (Field Programmable Gate Arrays) provide support for implementing the self-repair capability based on FPGA Partial Reconfiguration (PR) feature. Despite that there are many approaches which proposed self-repair processes, the measurement aspects are often omitted. Indeed, the measurement allows controlling the repair process and comparing the different approaches. In this paper, we discuss the self-repair capability measurement by proposing a common FPGA PR self-repair process followed by a set of hardware (HW) and software (SW) metrics dedicated particularly for FPGA PR-based IES.

Suggested Citation

  • Mohamed Sedik Chebout & Toufik Marir & Farid Mokhati, 2023. "Self-repair Measurement in FPGA-Based Partial Reconfigurable Systems," Lecture Notes in Information Systems and Organization, in: Varun Gupta & Luis Rubalcaba & Chetna Gupta & Thomas Hanne (ed.), Sustainability in Software Engineering and Business Information Management, pages 29-38, Springer.
    • Handle: RePEc:spr:lnichp:978-3-031-32436-9_3
    DOI: 10.1007/978-3-031-32436-9_3
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