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ENHANCED ELECTROCHROMIC PERFORMANCE OF WO3/NiO COMPLEMENTARY DEVICE WITH MnO2 BARRIER LAYER

Author

Listed:
  • MIN YEN YEH

    (Department of Microelectronics Engineering, National Kaohsiung University of Science and Technology, No. 142, Haijhuan Road, Nanzih District, Kaohsiung 81157, Taiwan)

  • SHIH PU YEH

    (Department of Microelectronics Engineering, National Kaohsiung University of Science and Technology, No. 142, Haijhuan Road, Nanzih District, Kaohsiung 81157, Taiwan)

  • YUN-SHIUAN YEH

    (��Department of Chemical Engineering, National Cheng Kung University, Tainan 701, Taiwan)

  • SHUN HSYUNG CHANG

    (Department of Microelectronics Engineering, National Kaohsiung University of Science and Technology, No. 142, Haijhuan Road, Nanzih District, Kaohsiung 81157, Taiwan)

  • JIN-HAU YEH

    (��School of Electrical and Computer Engineering, Purdue University, West Lafayette, Indiana 47907, USA)

  • SHIOW YUEH LEE

    (�Department of Materials and Optoelectronic Science, National Sun Yat-sen University, Kaohsiung 80424, Taiwan)

Abstract

This study investigates the enhancement of complementary electrochromic devices (ECDs) constructed with WO3/NiO layers by introducing a MnO2 barrier. The effects of NiO thickness and oxide layers on the electrochemical properties of the device were investigated. The device was constructed as ITO/MnO2/NiO/LiClO4-PC/WO3/ITO with LiClO4-PC as electrolyte. The response time showed a minimal increase with adding MnO2 to NiO. The device achieved 81.67% optical modulation at 550nm, with 1.80% and 83.67% transmittance in the colored and bleached states. The NiO thickness had a limited effect on the response time, with a deviation of less than 3s. MnO2-layered samples showed improved color retention, with a fade rate of 0.035% after 4h of coloring.

Suggested Citation

  • Min Yen Yeh & Shih Pu Yeh & Yun-Shiuan Yeh & Shun Hsyung Chang & Jin-Hau Yeh & Shiow Yueh Lee, 2025. "ENHANCED ELECTROCHROMIC PERFORMANCE OF WO3/NiO COMPLEMENTARY DEVICE WITH MnO2 BARRIER LAYER," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 32(07), pages 1-6, July.
    • Handle: RePEc:wsi:srlxxx:v:32:y:2025:i:07:n:s0218625x25400013
    DOI: 10.1142/S0218625X25400013
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