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DEPOSITION OF TiAlV THIN FILMS BY PULSED LASER AND DC MAGNETRON SPUTTERING: STRUCTURAL, COMPOSITIONAL AND ELECTROCHEMICAL CORROSION STUDY

Author

Listed:
  • A. ALKHAWWAM

    (Physics Department, Atomic Energy Commission, Damascus, Syria (AECS), P. O. Box 6091, Damascus, Syria)

  • B. ABDALLAH

    (Physics Department, Atomic Energy Commission, Damascus, Syria (AECS), P. O. Box 6091, Damascus, Syria)

  • A. K. JAZMATI

    (Physics Department, Atomic Energy Commission, Damascus, Syria (AECS), P. O. Box 6091, Damascus, Syria)

  • M. TOOTANJI

    (Physics Department, Atomic Energy Commission, Damascus, Syria (AECS), P. O. Box 6091, Damascus, Syria)

  • F. LAHLAH

    (Physics Department, Atomic Energy Commission, Damascus, Syria (AECS), P. O. Box 6091, Damascus, Syria)

Abstract

In this work, TiAlV thin films have been prepared on two different types of substrates: silicon and stainless steel (SS304) by two deposition methods: Pulsed Laser Deposition (PLD) and DC magnetron sputtering. Different techniques have been employed in order to characterize film properties such as: Scanning Electron Microscopy (SEM) equipped with Energy Dispersive X-ray (EDX), X-ray diffraction (XRD), microhardness and corrosion test. EDX analysis showed that the deposited films are slightly different from that of the target material Ti6Al4V alloy. The measured microhardness values are about 11.7GPa and 4.7GPa for films prepared by PLD and DC magnetron sputtering, respectively. Corrosion test indicated that the corrosion resistance of the two TiAlV films deposited on SS304 substrates in (0.9% NaCl) physiological normal saline medium was significantly improved compared with the SS304 substrates. These attractive results could permit applications of our films in the medical implants fabrication.

Suggested Citation

  • A. Alkhawwam & B. Abdallah & A. K. Jazmati & M. Tootanji & F. Lahlah, 2020. "DEPOSITION OF TiAlV THIN FILMS BY PULSED LASER AND DC MAGNETRON SPUTTERING: STRUCTURAL, COMPOSITIONAL AND ELECTROCHEMICAL CORROSION STUDY," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 27(08), pages 1-8, August.
    • Handle: RePEc:wsi:srlxxx:v:27:y:2020:i:08:n:s0218625x19501889
    DOI: 10.1142/S0218625X19501889
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