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ELECTROCHEMICAL MIGRATION BEHAVIOR OF Sn-3.0Ag-0.5Cu SOLDER ALLOY UNDER THIN ELECTROLYTE LAYERS

Author

Listed:
  • BOKAI LIAO

    (Hubei Key Laboratory of Materials Chemistry and Service Failure, School of Chemistry and Chemical Engineering, Huazhong University of Science and Technology, Wuhan 430074, P. R. China)

  • WENFENG JIA

    (#x2020;Sinopec Research Institute of Petroleum Engineering, Beijing 100101, P. R. China)

  • RUIYAN SUN

    (#x2021;Survey and Design Institute, Jilin Oilfield, Songyuan 138001, P. R. China)

  • ZHENYU CHEN

    (Hubei Key Laboratory of Materials Chemistry and Service Failure, School of Chemistry and Chemical Engineering, Huazhong University of Science and Technology, Wuhan 430074, P. R. China)

  • XINGPENG GUO

    (Hubei Key Laboratory of Materials Chemistry and Service Failure, School of Chemistry and Chemical Engineering, Huazhong University of Science and Technology, Wuhan 430074, P. R. China)

Abstract

The electrochemical migration (ECM) behavior of Sn-3.0Ag-0.5Cu solder alloy under thin electrolyte layers was investigated using a technique based on the coupling of in situ electrochemical measurements and optical observation. Results showed that the mean time to failure first increased and then decreased as thickness of the electrolyte layer increased, the maximum value was present at 200μm. The higher the bias voltage applied, the faster was the rate of dendrite growth. And, Sn leaded the ECM of SAC305 solder alloy. Mechanisms relevant have been proposed to explain the ECM behavior of Sn-3.0Ag-0.5Cu solder alloy.

Suggested Citation

  • Bokai Liao & Wenfeng Jia & Ruiyan Sun & Zhenyu Chen & Xingpeng Guo, 2019. "ELECTROCHEMICAL MIGRATION BEHAVIOR OF Sn-3.0Ag-0.5Cu SOLDER ALLOY UNDER THIN ELECTROLYTE LAYERS," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 26(06), pages 1-7, July.
  • Handle: RePEc:wsi:srlxxx:v:26:y:2019:i:06:n:s0218625x18502086
    DOI: 10.1142/S0218625X18502086
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    Cited by:

    1. Maria Abu Bakar & A. Atiqah & Azman Jalar, 2022. "Review on Corrosion in Electronic Packaging Trends of Collaborative between Academia–Industry," Sustainability, MDPI, vol. 14(23), pages 1-33, November.

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