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SYSTEMATIC EXPLORATION OF THE EFFECTS OF CR-DOPING ON MICROSTRUCTURE, INSULATING, AND FERROELECTRIC PROPERTIES OF BiFeO3 THIN FILM

Author

Listed:
  • HUITING SUI

    (School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, P. R. China2Advanced Ceramics Institute of Zibo New & High-Tech Industrial Development Zone, Zibo 255000, P. R. China)

  • HUAJUN SUN

    (School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, P. R. China2Advanced Ceramics Institute of Zibo New & High-Tech Industrial Development Zone, Zibo 255000, P. R. China)

  • XIAOFANG LIU

    (School of Chemistry, Chemical Engineering and Life Sciences, Wuhan University of Technology, Wuhan 430070, P. R. China)

  • SHANSHAN GUO

    (School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, P. R. China)

  • HUAN YANG

    (School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, P. R. China)

  • RENXIN XU

    (School of Materials Science and Engineering, Wuhan University of Technology, Wuhan 430070, P. R. China)

Abstract

BiFe1−xCrxO3 (xBFCO, x=0.01, 0.02, 0.03, 0.04, 0.05) thin films were successfully fabricated onto Pt(111)/TiO2/SiO2/Si substrate via a solgel process. The correlation between microstructure and insulating, ferroelectric properties of xBFCO thin films are investigated. The leakage behavior for all the thin films is in accordance with the Ohmic conduction and FN Tunneling emission during low and high electric field region, respectively. Compared with the pure BFO, all the thin films with Cr3+ doping possess reduced leakage current density by 1–2 orders of magnitude, with the lowest value approximately 10−4 at 200kV/cm. Moreover, the 0.04BFCO thin film exhibits the maximum remanent polarization (Pr) value of 29.8μC/cm2 with a great fatigue behavior, which could be ascribed to the absence of impurity phase and reduced leakage current.

Suggested Citation

  • Huiting Sui & Huajun Sun & Xiaofang Liu & Shanshan Guo & Huan Yang & Renxin Xu, 2019. "SYSTEMATIC EXPLORATION OF THE EFFECTS OF CR-DOPING ON MICROSTRUCTURE, INSULATING, AND FERROELECTRIC PROPERTIES OF BiFeO3 THIN FILM," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 26(03), pages 1-7, April.
    • Handle: RePEc:wsi:srlxxx:v:26:y:2019:i:03:n:s0218625x18501664
    DOI: 10.1142/S0218625X18501664
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