Author
Listed:
- Y. H. A. FAWZY
(Radiation Physics Department, National Center for Radiation Research and Technology (NCRRT), Atomic Energy Authority (AEA), Cairo, Egypt)
- H. M. ABDEL-HAMID
(Radiation Physics Department, National Center for Radiation Research and Technology (NCRRT), Atomic Energy Authority (AEA), Cairo, Egypt†Diagnostic Radiology Department, Faculty of Applied Medical Sciences, Jazan University, Jazan, Saudi Arabia)
- M. M. EL-OKR
(#x2021;Physics Department, Faculty of Science, Al-Azhar University, Cairo, Egypt)
- A. ATTA
(Radiation Physics Department, National Center for Radiation Research and Technology (NCRRT), Atomic Energy Authority (AEA), Cairo, Egypt)
Abstract
Polyethylene terephthalate (PET) films with thickness 40μm are irradiated with 3keV argon ion beams with different fluence ranging from 0.5×1018ions.cm−2 to 2×1018ions.cm−2 using locally designed broad ion source. The changes in the PET structure are characterized using X-ray diffraction (XRD), Fourier transform infrared (FTIR) and scanning electron microscope (SEM) techniques. The XRD patterns show that the peak intensity decreases with irradiation and the particle size decreases from 65.75 Å for the un-irradiated to 52.80 Å after irradiation. The FTIR indicates partial decrease and reduction in the intensity of the bands due to the degradation of the polymer after ion irradiation. The optical energy band gap decreases from 3.14eV to 3.05eV and the number of carbon cluster increases from 119 to 126 after ion irradiation. The results show a slight increase in the electrical conductivities and the dielectric constant (ε). The results indicate the effectiveness of using PET films as capacitors and resistors in industrial applications.
Suggested Citation
Y. H. A. Fawzy & H. M. Abdel-Hamid & M. M. El-Okr & A. Atta, 2018.
"STRUCTURAL, OPTICAL AND ELECTRICAL PROPERTIES OF PET POLYMER FILMS MODIFIED BY LOW ENERGY Ar+ ION BEAMS,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 25(03), pages 1-7, April.
Handle:
RePEc:wsi:srlxxx:v:25:y:2018:i:03:n:s0218625x1850066x
DOI: 10.1142/S0218625X1850066X
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