IDEAS home Printed from https://ideas.repec.org/a/wsi/srlxxx/v24y2017isupp02ns0218625x18500178.html
   My bibliography  Save this article

STRUCTURAL, ELECTRICAL AND OPTICAL PROPERTIES OF TiO2 THIN FILM DEPOSITED ON THE NANO POROUS SILICON TEMPLATE

Author

Listed:
  • MAHMOOD BAHAR

    (Department of Physics, Islamic Azad University, Tehran North Branch, Tehran, Iran†Faculty of Physics, Kharazmi University, Tehran, Iran)

  • ENSIEH KHALILI DERMANI

    (#x2020;Faculty of Physics, Kharazmi University, Tehran, Iran)

Abstract

The porous silicon (PSi), which is produced by the electrochemical etching, has been used as a substrate for the growth of the titanium oxide (TiO2) thin films. By using the EBPVD method, TiO2 thin films have been deposited on the surface of the PSi substrate. TiO2/PSi layers were annealed at the temperature of 400∘C, 500∘C and 600∘C for different tests. The morphology and structures of layers were investigated by the scanning electron microscopy (SEM) and X-ray diffraction (XRD). The current–voltage characteristic curves of samples and the ideality factor of heterojunction were studied. The results showed that the electrical properties of the samples change with increase in the annealing temperature. The optical properties of the prepared samples were investigated by using UV–Vis and photoluminescence (PL) spectroscopy. Green light emission of the PSi combined with the blue light and violet–blue emission obtained from the TiO2/PSi PL spectra. The results showed that the optical band gap energy of the PSi has increased from 1.86eV to 2.93eV due to the deposition of TiO2 thin film.

Suggested Citation

  • Mahmood Bahar & Ensieh Khalili Dermani, 2017. "STRUCTURAL, ELECTRICAL AND OPTICAL PROPERTIES OF TiO2 THIN FILM DEPOSITED ON THE NANO POROUS SILICON TEMPLATE," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 24(Supp02), pages 1-5, November.
    • Handle: RePEc:wsi:srlxxx:v:24:y:2017:i:supp02:n:s0218625x18500178
    DOI: 10.1142/S0218625X18500178
    as

    Download full text from publisher

    File URL: http://www.worldscientific.com/doi/abs/10.1142/S0218625X18500178
    Download Restriction: Access to full text is restricted to subscribers
    File URL: https://libkey.io/10.1142/S0218625X18500178?utm_source=ideas
    LibKey link: if access is restricted and if your library uses this service, LibKey will redirect you to where you can use your library subscription to access this item
    ---><---

    As the access to this document is restricted, you may want to search for a different version of it.

    More about this item

    Keywords

    Porous silicon; thin films; TiO2/PSi;
    All these keywords.

    JEL classification:

    Statistics

    Access and download statistics

    Corrections

    All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:wsi:srlxxx:v:24:y:2017:i:supp02:n:s0218625x18500178. See general information about how to correct material in RePEc.

    If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.

    We have no bibliographic references for this item. You can help adding them by using this form .

    If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.

    For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Tai Tone Lim (email available below). General contact details of provider: http://www.worldscinet.com/srl/srl.shtml .

    Please note that corrections may take a couple of weeks to filter through the various RePEc services.

    IDEAS is a RePEc service. RePEc uses bibliographic data supplied by the respective publishers.