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Increase In The Reflected Intensity Of X-Ray Films Using Photonic Crystals

Author

Listed:
  • ARAFA H. ALY

    (Physics Department, Faculty of Science, Beni-Suef University, Beni-Suef, Egypt)

  • M. F. EISSA

    (Physics Department, Faculty of Science, Beni-Suef University, Beni-Suef, Egypt)

Abstract

Photographic film is the familiar image of recording X-ray method. Examinations performed with radiographic intensifying screens reduce the patient’s exposure to radiation of X-rays compared with those without radiographic intensifying screens, where it directs less than half of the light emitted from the X-ray film with a screen interaction. A reflective layer made of magnesium oxide or titanium dioxide is located between the screen and the base of the film; this layer can help regain the control of the header light in other directions and is forwarded to the film. One-dimensional array of photonic crystals (PCs) consists of MgO with Al and TiO2 with Al used as reflectors. This array may increase the reflected intensity by an amount of 10.88% if MgO–Al PCs with periodicity N=1 are used as reflectors.

Suggested Citation

  • Arafa H. Aly & M. F. Eissa, 2017. "Increase In The Reflected Intensity Of X-Ray Films Using Photonic Crystals," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 24(08), pages 1-5, December.
    • Handle: RePEc:wsi:srlxxx:v:24:y:2017:i:08:n:s0218625x17501062
    DOI: 10.1142/S0218625X17501062
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