Author
Listed:
- LIAN CUI
(School of Mechatronics Engineering, Daqing Normal University, Daqing 163712, P. R. China)
- HAIYING CUI
(School of Mechatronics Engineering, Daqing Normal University, Daqing 163712, P. R. China)
- CHUNMEI WU
(School of Mechatronics Engineering, Daqing Normal University, Daqing 163712, P. R. China)
- GUIHUA YANG
(School of Mechatronics Engineering, Daqing Normal University, Daqing 163712, P. R. China)
- ZELONG HE
(#x2020;School of Electrical and Information Engineering, Heilongjiang Institute of Technology, Harbin 150050, P. R. China)
- YULING WANG
(School of Mechatronics Engineering, Daqing Normal University, Daqing 163712, P. R. China)
- JIXIN CHE
(#x2021;Ordnance Engineering Department, Air Force Aviation University, Changchun, 130022, P. R. China)
Abstract
In this paper, frequency, temperature, film thickness, surface effects, and various parameters dependence of dielectric susceptibility is investigated theoretically for ferroelectric thin films by the modified Landau theory under an AC applied field. The dielectric susceptibility versus AC applied field shows butterfly-shaped behavior, and depends strongly on the frequency and amplitude of the field and temperature. Our study shows that the existence of the surface transition layer can depress the dielectric susceptibility of a ferroelectric thin film. These results are well consistent with the phenomena reported in experiments.
Suggested Citation
Lian Cui & Haiying Cui & Chunmei Wu & Guihua Yang & Zelong He & Yuling Wang & Jixin Che, 2016.
"Dynamic Properties Of Dielectric Susceptibility In Ferroelectric Thin Films,"
Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 23(03), pages 1-6, June.
Handle:
RePEc:wsi:srlxxx:v:23:y:2016:i:03:n:s0218625x16500104
DOI: 10.1142/S0218625X16500104
Download full text from publisher
As the access to this document is restricted, you may want to
for a different version of it.
Corrections
All material on this site has been provided by the respective publishers and authors. You can help correct errors and omissions. When requesting a correction, please mention this item's handle: RePEc:wsi:srlxxx:v:23:y:2016:i:03:n:s0218625x16500104. See general information about how to correct material in RePEc.
If you have authored this item and are not yet registered with RePEc, we encourage you to do it here. This allows to link your profile to this item. It also allows you to accept potential citations to this item that we are uncertain about.
We have no bibliographic references for this item. You can help adding them by using this form .
If you know of missing items citing this one, you can help us creating those links by adding the relevant references in the same way as above, for each refering item. If you are a registered author of this item, you may also want to check the "citations" tab in your RePEc Author Service profile, as there may be some citations waiting for confirmation.
For technical questions regarding this item, or to correct its authors, title, abstract, bibliographic or download information, contact: Tai Tone Lim (email available below). General contact details of provider: http://www.worldscinet.com/srl/srl.shtml .
Please note that corrections may take a couple of weeks to filter through
the various RePEc services.