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Dynamic Properties Of Dielectric Susceptibility In Ferroelectric Thin Films

Author

Listed:
  • LIAN CUI

    (School of Mechatronics Engineering, Daqing Normal University, Daqing 163712, P. R. China)

  • HAIYING CUI

    (School of Mechatronics Engineering, Daqing Normal University, Daqing 163712, P. R. China)

  • CHUNMEI WU

    (School of Mechatronics Engineering, Daqing Normal University, Daqing 163712, P. R. China)

  • GUIHUA YANG

    (School of Mechatronics Engineering, Daqing Normal University, Daqing 163712, P. R. China)

  • ZELONG HE

    (#x2020;School of Electrical and Information Engineering, Heilongjiang Institute of Technology, Harbin 150050, P. R. China)

  • YULING WANG

    (School of Mechatronics Engineering, Daqing Normal University, Daqing 163712, P. R. China)

  • JIXIN CHE

    (#x2021;Ordnance Engineering Department, Air Force Aviation University, Changchun, 130022, P. R. China)

Abstract

In this paper, frequency, temperature, film thickness, surface effects, and various parameters dependence of dielectric susceptibility is investigated theoretically for ferroelectric thin films by the modified Landau theory under an AC applied field. The dielectric susceptibility versus AC applied field shows butterfly-shaped behavior, and depends strongly on the frequency and amplitude of the field and temperature. Our study shows that the existence of the surface transition layer can depress the dielectric susceptibility of a ferroelectric thin film. These results are well consistent with the phenomena reported in experiments.

Suggested Citation

  • Lian Cui & Haiying Cui & Chunmei Wu & Guihua Yang & Zelong He & Yuling Wang & Jixin Che, 2016. "Dynamic Properties Of Dielectric Susceptibility In Ferroelectric Thin Films," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 23(03), pages 1-6, June.
    • Handle: RePEc:wsi:srlxxx:v:23:y:2016:i:03:n:s0218625x16500104
    DOI: 10.1142/S0218625X16500104
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