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Optimization Of Cvd Diamond Coating Type On Micro Drills In Pcb Machining

Author

Listed:
  • X. L. LEI

    (School of Mechanical and Power Engineering, East China University of Science and Technology, Shanghai 200237, P. R. China)

  • Y. HE

    (School of Mechanical and Power Engineering, East China University of Science and Technology, Shanghai 200237, P. R. China)

  • F. H. SUN

    (#x2020;School of Mechanical Engineering, Shanghai Jiao Tong University, Shanghai 200240, P. R. China)

Abstract

The demand for better tools for machining printed circuit boards (PCBs) is increasing due to the extensive usage of these boards in digital electronic products. This paper is aimed at optimizing coating type on micro drills in order to extend their lifetime in PCB machining. First, the tribotests involving micro crystalline diamond (MCD), nano crystalline diamond (NCD) and bare tungsten carbide (WC-Co) against PCBs show that NCD–PCB tribopair exhibits the lowest friction coefficient (0.35) due to the unique nano structure and low surface roughness of NCD films. Thereafter, the dry machining performance of the MCD- and NCD-coated micro drills on PCBs is systematically studied, using diamond-like coating (DLC) and TiAlN-coated micro drills as comparison. The experiments show that the working lives of these micro drills can be ranked as: NCD>TiAlN>DLC>MCD>bare WC-Co. The superior cutting performance of NCD-coated micro drills in terms of the lowest flank wear growth rate, no tool degradation (e.g. chipping, tool tipping) appearance, the best hole quality as well as the lowest feed force may come from the excellent wear resistance, lower friction coefficient against PCB as well as the high adhesive strength on the underneath substrate of NCD films.

Suggested Citation

  • X. L. Lei & Y. He & F. H. Sun, 2016. "Optimization Of Cvd Diamond Coating Type On Micro Drills In Pcb Machining," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 23(02), pages 1-8, April.
    • Handle: RePEc:wsi:srlxxx:v:23:y:2016:i:02:n:s0218625x15501085
    DOI: 10.1142/S0218625X15501085
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