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INVESTIGATING ANNEALING EFFECT ON OPTICAL PROPERTIES OFCd0.8Zn0.2STHIN FILMS

Author

Listed:
  • SOMAYEH AZIZI

    (Thin Film Laboratory, Faculty of Physics, Semnan University, Semnan, Iran)

  • HAMID REZAGHOLIPOUR DIZAJI

    (Thin Film Laboratory, Faculty of Physics, Semnan University, Semnan, Iran)

  • MOHAMMAD HOSSEIN EHSANI

    (Thin Film Laboratory, Faculty of Physics, Semnan University, Semnan, Iran)

  • SEYED FEYZOLAH GHAVAMI MIRMAHALLE

    (Thin Film Laboratory, Faculty of Physics, Semnan University, Semnan, Iran)

Abstract

Cd0.8Zn0.2Sthin films deposited on glass substrates by thermal evaporation method were annealed at different temperatures for the first time in order to investigate annealing effect on optical properties. The compositional, structural of nanoparticles precursor synthesized using microwave irradiation method and optical properties of the films were studied using energy dispersive X-ray (EDX), X-ray diffraction, transmission electron microscopy (TEM), and UV-visible spectrophotometer techniques. The annealed films were found to have hexagonal Wurtzite structure with strong preferential orientation along the (002) diffraction peak. Important optical parameters such as extinction coefficient and refractive index revealed the effect of heat treatment on the deposited thin layers. A reduction in the band gap energy from 2.41 eV to 2.29 eV was observed for the annealed samples.

Suggested Citation

  • Somayeh Azizi & Hamid Rezagholipour Dizaji & Mohammad Hossein Ehsani & Seyed Feyzolah Ghavami Mirmahalle, 2014. "INVESTIGATING ANNEALING EFFECT ON OPTICAL PROPERTIES OFCd0.8Zn0.2STHIN FILMS," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 21(05), pages 1-7.
    • Handle: RePEc:wsi:srlxxx:v:21:y:2014:i:05:n:s0218625x14500735
    DOI: 10.1142/S0218625X14500735
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