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Modulations In Low-Temperature Transient Reflectivity Measurements

Author

Listed:
  • SALAHUDDIN KHAN

    (Laser Physics Applications Section, Raja Ramanna Centre for Advanced Technology, Indore, India)

  • RAMA CHARI

    (Laser Physics Applications Section, Raja Ramanna Centre for Advanced Technology, Indore, India)

  • J. JAYABALAN

    (Laser Physics Applications Section, Raja Ramanna Centre for Advanced Technology, Indore, India)

  • SUPARNA PAL

    (Solid State Laser Division, Raja Ramanna Centre for Advanced Technology, Indore, India)

  • T. K. SHARMA

    (Solid State Laser Division, Raja Ramanna Centre for Advanced Technology, Indore, India)

  • A. K. SAGAR

    (Cryo-Engineering and Cryo-Module Development Section, Raja Ramanna Centre for Advanced Technology, Indore, India)

  • M. S. ANSARI

    (Cryo-Engineering and Cryo-Module Development Section, Raja Ramanna Centre for Advanced Technology, Indore, India)

  • P. K. KUSH

    (Cryo-Engineering and Cryo-Module Development Section, Raja Ramanna Centre for Advanced Technology, Indore, India)

Abstract

Periodic modulations that appear in the low-temperature transient reflectivity signal of aGaAsP/AlGaAssingle quantum well is studied. Similar anomalous oscillations are also reported in layered manganite [K. Kouyamaet al.,J. Phys. Soc. Jpn.76(2007) 123702(1–3).] We show that such periodic modulations are caused by changes in the linear reflectivity of the sample during transient reflectivity measurements. Studies carried out on reflectivity of different materials under identical conditions show that these modulations on the true transient reflectivity signal are caused by condensation of residual gases on the surface of quantum well. Methods to obtain reliable transient reflectivity data are also described.

Suggested Citation

  • Salahuddin Khan & Rama Chari & J. Jayabalan & Suparna Pal & T. K. Sharma & A. K. Sagar & M. S. Ansari & P. K. Kush, 2014. "Modulations In Low-Temperature Transient Reflectivity Measurements," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 21(01), pages 1-7.
    • Handle: RePEc:wsi:srlxxx:v:21:y:2014:i:01:n:s0218625x1450005x
    DOI: 10.1142/S0218625X1450005X
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