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EFFECT OFTiO2ON STRUCTURE AND DIELECTRIC PROPERTIES OFRO-Al2O3-B2O3-SiO2(R=Ca,Mg)GLASSES

Author

Listed:
  • XUEHONG ZHANG

    (School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China)

  • ZHAO DU

    (School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China)

  • HAITAO WU

    (School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China)

  • YUNLONG YUE

    (School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China)

Abstract

RO-Al2O3-B2O3-SiO2(R=Ca,Mg)glasses containing different concentrations ofTiO2(ranging from 0 to 9 mol.%) were prepared by conventional melting method. WhenTiO2was present in lower concentrations (≤ 6 mol.%), Fourier-transform infrared spectroscopy (FTIR) indicated that titanium ions took part in network forming positions. However, for further increase in the concentration ofTiO2(> 6 mol.%), FTIR data indicated the formation ofTiO4tetrahedrons andTiO6octahedrons. The glass transition temperatures(Tg)were determined using a differential scanning calorimetry (DSC). TheTgvariation with the concentration ofTiO2showed an increasing trend up to 6 mol.% ofTiO2and beyond this concentration,Tgwas found to decrease. The dielectric constantεrand loss tan δ continued to decrease with the concentration ofTiO2up to 6 mol.% and beyond thatεrand tan δ were found to increase. This behavior was mainly explained in terms of the rigidity of glass network.

Suggested Citation

  • Xuehong Zhang & Zhao Du & Haitao Wu & Yunlong Yue, 2013. "EFFECT OFTiO2ON STRUCTURE AND DIELECTRIC PROPERTIES OFRO-Al2O3-B2O3-SiO2(R=Ca,Mg)GLASSES," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 20(03n04), pages 1-5.
    • Handle: RePEc:wsi:srlxxx:v:20:y:2013:i:03n04:n:s0218625x13500303
    DOI: 10.1142/S0218625X13500303
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