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EFFECT OFMgOON STRUCTURE AND DIELECTRIC PROPERTIES OFCaO–Al2O3–B2O3–SiO2GLASSES

Author

Listed:
  • ZHAO DU

    (School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China)

  • XUEHONG ZHANG

    (School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China)

  • YUNLONG YUE

    (School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China)

  • HAITAO WU

    (School of Materials Science and Engineering, Shandong Provincial Key Laboratory of Preparation and Measurement of Building Materials, University of Jinan, Jinan 250022, China)

Abstract

The effect ofMgOon structure and dielectric properties of aluminoborosilicate glasses was investigated. FTIR data indicated that glass network was mainly built by tetrahedral[SiO4],[BO4],[AlO4]and trigonal[BO3]. A small amount ofAlO5orAlO6units also existed. The glass system was characterized with lower dielectric constant (4.17 ~ 4.6) and dielectric loss (12.3 × 10-4~ 14.77 × 10-4) at 1 MHz. With the increase ofMgOcontent, the quantity ofAlO5orAlO6units decreased. The variation of density showed a decreasing tendency. The dielectric constant and loss were all found to decrease.

Suggested Citation

  • Zhao Du & Xuehong Zhang & Yunlong Yue & Haitao Wu, 2012. "EFFECT OFMgOON STRUCTURE AND DIELECTRIC PROPERTIES OFCaO–Al2O3–B2O3–SiO2GLASSES," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 19(06), pages 1-4.
    • Handle: RePEc:wsi:srlxxx:v:19:y:2012:i:06:n:s0218625x12500631
    DOI: 10.1142/S0218625X12500631
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