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POLARIZATION FATIGUE BEHAVIORS INBi3.5Nd0.5Ti3O12FERROELECTRIC THIN FILMS

Author

Listed:
  • C. P. CHENG

    (Faculty of Science, Hunan Institute of Engineering, Xiangtan, Hunan, 411105, China)

  • B. JIANG

    (Key Laboratory of Low Dimensional Materials and Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan 411105, China)

  • M. H. TANG

    (Key Laboratory of Low Dimensional Materials and Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan 411105, China)

  • G. Y. WANG

    (Key Laboratory of Low Dimensional Materials and Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan 411105, China)

  • S. B. YANG

    (Key Laboratory of Low Dimensional Materials and Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan 411105, China)

  • H. Y. XU

    (Key Laboratory of Low Dimensional Materials and Application Technology (Xiangtan University), Ministry of Education, Xiangtan, Hunan 411105, China)

Abstract

The evolution of the fatigue behaviors inBi3.5Nd0.5Ti3O12(BNT) ferroelectric thin films deposited onPt(111)/Ti/SiO2/Si(100)substrates by chemical solution deposition (CSD) method effected by amplitude, frequency and profile of the driving electric field were reported. It is found that the switching with lower frequency and higher amplitude of the external voltages resulted in higher fatigue rates and only bipolar waveform type voltage can result in fatigue, whereas a unipolar voltage cannot. An empirical function withN/fis proposed in the frequency-dependence of polarization fatigue, whereNis the number of switching cycles andfis the frequency of driving. It is indicated that injected charges from electrodes into films, the trapped charges, and suppression of the seeds of opposite domain nucleation are the main mechanism of fatigue in ferroelectric BNT thin films.

Suggested Citation

  • C. P. Cheng & B. Jiang & M. H. Tang & G. Y. Wang & S. B. Yang & H. Y. Xu, 2011. "POLARIZATION FATIGUE BEHAVIORS INBi3.5Nd0.5Ti3O12FERROELECTRIC THIN FILMS," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 18(05), pages 203-208.
    • Handle: RePEc:wsi:srlxxx:v:18:y:2011:i:05:n:s0218625x11014680
    DOI: 10.1142/S0218625X11014680
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