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ENHANCEMENT OF SUPERCONDUCTIVITY OFPbULTRA-THIN FILMS BY THE INTERFACE EFFECT

Author

Listed:
  • WEN-JUAN LI

    (Institute of Physics, The Chinese Academy of Sciences, Beijing 100190, China)

  • YU-JIE SUN

    (Key Laboratory of Atomic and Nanosciences, Department of Physics, Tsinghua University, Beijing 100084, China)

  • TONG ZHANG

    (Institute of Physics, The Chinese Academy of Sciences, Beijing 100190, China)

  • XIE-GANG ZHU

    (Key Laboratory of Atomic and Nanosciences, Department of Physics, Tsinghua University, Beijing 100084, China)

  • GUANG WANG

    (Key Laboratory of Atomic and Nanosciences, Department of Physics, Tsinghua University, Beijing 100084, China)

  • JIN-FENG JIA

    (Key Laboratory of Atomic and Nanosciences, Department of Physics, Tsinghua University, Beijing 100084, China)

  • XUCUN MA

    (Institute of Physics, The Chinese Academy of Sciences, Beijing 100190, China)

  • XI CHEN

    (Key Laboratory of Atomic and Nanosciences, Department of Physics, Tsinghua University, Beijing 100084, China)

  • QI-KUN XUE

    (Institute of Physics, The Chinese Academy of Sciences, Beijing 100190, China;
    Key Laboratory of Atomic and Nanosciences, Department of Physics, Tsinghua University, Beijing 100084, China)

Abstract

We have studied the superconductivity ofPbultra-thin films with thickness from 1 monolayer (ML) to 7 ML grown onSi(111)by molecular beam epitaxy.In situlow temperature scanning tunneling spectroscopy (STS) and angle-resolved photoemission spectroscopy (ARPES) measurements were performed on the films. It is suggested that the interface effect plays a critical role in enhancing the electron-phonon coupling, which consequently increases the superconducting transition temperature when a film reaches to the two-dimensional limit.

Suggested Citation

  • Wen-Juan Li & Yu-Jie Sun & Tong Zhang & Xie-Gang Zhu & Guang Wang & Jin-Feng Jia & Xucun Ma & Xi Chen & Qi-Kun Xue, 2010. "ENHANCEMENT OF SUPERCONDUCTIVITY OFPbULTRA-THIN FILMS BY THE INTERFACE EFFECT," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 17(04), pages 437-440.
    • Handle: RePEc:wsi:srlxxx:v:17:y:2010:i:04:n:s0218625x10014235
    DOI: 10.1142/S0218625X10014235
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