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STUDY OF ELECTRICAL CONDUCTIVITY FOR COPPER NANOPARTICLES WITH VAPOR-DEPOSITED SAMs

Author

Listed:
  • GYE-YOUNG LEE

    (Division of Materials and Chemical Engineering, Hanyang University, Gyeonggi-do 426-791, Korea)

  • MI-RYN SEONG

    (Division of Materials and Chemical Engineering, Hanyang University, Gyeonggi-do 426-791, Korea)

  • JINHYEONG KWON

    (Division of Materials and Chemical Engineering, Hanyang University, Gyeonggi-do 426-791, Korea)

  • DONG-KWON KIM

    (Division of Materials and Chemical Engineering, Hanyang University, Gyeonggi-do 426-791, Korea)

  • CAROLINE SUNYONG LEE

    (Division of Materials and Chemical Engineering, Hanyang University, Gyeonggi-do 426-791, Korea)

  • GI-RA YI

    (Korea Basic Science Institute, Daejeon, 305-333, Korea)

  • YOUNG-SEOK KIM

    (Korea Electronics Technology Institute, Gyeonggi-do 463-816, Korea)

Abstract

A self-assembled monolayer (SAM) of octanethiol was vapor-deposited onto the surface of copper (Cu) nanoparticles as a means of preventing oxidation. The presence of octanethiol on the surface ofCunanoparticles was verified using Fourier transform infrared spectroscopy and transmission electron microscopy. The electrical resistance of copper nanoparticles with deposition of a 12-nm thickness of octanethiol on the surface was found to be 100 times greater than that of uncoated powders, indicating uniform SAM coating of the particles.

Suggested Citation

  • Gye-Young Lee & Mi-Ryn Seong & Jinhyeong Kwon & Dong-Kwon Kim & Caroline Sunyong Lee & Gi-Ra Yi & Young-Seok Kim, 2009. "STUDY OF ELECTRICAL CONDUCTIVITY FOR COPPER NANOPARTICLES WITH VAPOR-DEPOSITED SAMs," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 16(04), pages 519-523.
    • Handle: RePEc:wsi:srlxxx:v:16:y:2009:i:04:n:s0218625x09013098
    DOI: 10.1142/S0218625X09013098
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