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CHARACTERIZATION OFTiB2COATING ADHERENCE BY A MULTI-PASS SCRATCH TESTING

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Listed:
  • YASAR TOTIK

    (Surface Technologies and Biomechanics Research Laboratory, Engineering Faculty, Department of Mechanical Engineering, Ataturk University, 25240 Erzurum, Turkey)

  • ERSIN ARSLAN

    (Surface Technologies and Biomechanics Research Laboratory, Engineering Faculty, Department of Mechanical Engineering, Ataturk University, 25240 Erzurum, Turkey)

  • IHSAN EFEOGLU

    (Surface Technologies and Biomechanics Research Laboratory, Engineering Faculty, Department of Mechanical Engineering, Ataturk University, 25240 Erzurum, Turkey)

  • IRFAN KAYMAZ

    (Surface Technologies and Biomechanics Research Laboratory, Engineering Faculty, Department of Mechanical Engineering, Ataturk University, 25240 Erzurum, Turkey)

Abstract

TiB2films deposited using various deposition techniques are used to increase the wear lifetime of industrial components. The performance ofTiB2films is dependent on the coating–substrate adhesion. In this study, the fatigue behavior ofTiB2films was investigated using the multi-mode scratch method. Films ofTiB2were deposited on silicon wafers and AISI M2 steel substrates at different frequencies by pulsed-dc closed field unbalanced magnetron sputtering (CFUBMS). The microstructures of the films were investigated using SEM techniques, and the hardness was measured using a microhardness tester. A multi-mode operation was used for sliding-fatigue, like multi-pass scratching in the same track at different fractions of critical load (bidirectional sliding) and a standard mode using progressive load operation. It was observed that the films deposited at low frequencies had higher adhesion strength and microhardness, and a denser microstructure.

Suggested Citation

  • Yasar Totik & Ersin Arslan & Ihsan Efeoglu & Irfan Kaymaz, 2009. "CHARACTERIZATION OFTiB2COATING ADHERENCE BY A MULTI-PASS SCRATCH TESTING," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 16(03), pages 329-335.
    • Handle: RePEc:wsi:srlxxx:v:16:y:2009:i:03:n:s0218625x09012676
    DOI: 10.1142/S0218625X09012676
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