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THEFeULTRATHIN FILM ONZnO(000-1)SURFACE: GROWTH, STRUCTURE, AND INTERACTION

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  • GUO-DONG WANG

    (National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029, P.R. China)

  • FA-QIANG XU

    (National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029, P.R. China)

  • WANG ZHANG

    (National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029, P.R. China)

  • WEN-HUA ZHANG

    (National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029, P.R. China)

  • ZONG-MU LI

    (National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei, Anhui 230029, P.R. China)

Abstract

We report the electronic structure of the interface of the ultrafilmFefilm with theO-terminatedZnO(000-1)polar surface studied by synchrotron radiation photoemission. It was found thatFegrows in a Stranski–Krastanov mode. The turning point of the growth mode was at theFecoverage of ~2 Å. At low coverage, about 1 ML (monolayer) of iron (ca.1.5 Å) was oxidized by the terminative oxygen atoms on theZnO(000-1)surface. Analysis of the valence band and theFe3pphotoemission spectra indicates that below 2 Å coverage, onlyFe2+species could be detected at theFe/ZnOinterface, after that the formation of a metallic iron overlayer was observed. A sharp Fermi edge appeared at 5.1 Å coverage, indicating the formation of the bulk metallicFefilm. Furthermore, work function of the sample decreased to a minimum of 4.5 eV at 0.2 ÅFe, and then to 4.9 eV with the formation of a dipole layer at the interface.

Suggested Citation

  • Guo-Dong Wang & Fa-Qiang Xu & Wang Zhang & Wen-Hua Zhang & Zong-Mu Li, 2008. "THEFeULTRATHIN FILM ONZnO(000-1)SURFACE: GROWTH, STRUCTURE, AND INTERACTION," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 15(03), pages 295-300.
    • Handle: RePEc:wsi:srlxxx:v:15:y:2008:i:03:n:s0218625x0801138x
    DOI: 10.1142/S0218625X0801138X
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