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OPTICAL WAVEGUIDE FABRICATION AND REFRACTIVE INDEX CHARACTERIZATION OFNd:LuVO4THIN FILMS BY PULSED LASER DEPOSITION

Author

Listed:
  • HONGXIA LI

    (The MOE Key Laboratory of Mechanical Manufacture and Automation, Zhejiang University of Technology, Hangzhou 310014, China)

  • XIN WU

    (School of Mechanical Engineering, Hangzhou Dianzi University, Hangzhou 310018, China)

  • RENGUO SONG

    (The MOE Key Laboratory of Mechanical Manufacture and Automation, Zhejiang University of Technology, Hangzhou 310014, China)

  • JIYANG WANG

    (State Key Laboratory of Crystal Growth, Shandong University, Jinan 250100, China)

Abstract

High-qualityNd:LuVO4thin films have been grown on silica glass substrates by using a pulsed laser deposition technique. X-ray diffraction results show that the as-depositedNd:LuVO4film is basically oriented polycrystalline, and strong (200) peak was revealed. The waveguide property was characterized by the prism-coupling method. The refractive index of the propagation mode is higher than that of the silica glass substrate which means that the dips correspond to real propagation mode, where the light could be well defined. The surface morphology of the depositedNd:LuVO4films was also observed by using an atomic force microscopy.

Suggested Citation

  • Hongxia Li & Xin Wu & Renguo Song & Jiyang Wang, 2007. "OPTICAL WAVEGUIDE FABRICATION AND REFRACTIVE INDEX CHARACTERIZATION OFNd:LuVO4THIN FILMS BY PULSED LASER DEPOSITION," Surface Review and Letters (SRL), World Scientific Publishing Co. Pte. Ltd., vol. 14(06), pages 1079-1082.
  • Handle: RePEc:wsi:srlxxx:v:14:y:2007:i:06:n:s0218625x07010652
    DOI: 10.1142/S0218625X07010652
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